PCIM provides platform for Rogowski technology demo
The PCIM exhibition in Nuremberg (May 19-20) provides a platform for Power Electronic Measurements to demonstrate its full range of Rogowski technology based wide-bandwidth current probes. Featuring the latest CWT MiniHF, the company will show how this AC probe provides better common mode immunity to local high voltage transients, and provides a more precise measurement delay which can be compensated for to give improved power loss measurement in power semiconductors using SiC and GaN technology.
Combining a novel shielding technique, utilising a low sensitivity coil and patented low-noise signal-conditioning circuitry, the CWT MiniHF wide-band screened probe boosts immunity to local dV/dt transients while maintaining small size, flexibility, and 3dB bandwidth of up to 30MHz for a 100mm coil.
The probes feature a coil only 4.5mm thick with 5kV insulation voltage, and can handle maximum current slope of 100kA/µs.
PEM’s Director of Engineering, Joanne Aberdeen will also be delivering a vendor presentation on Wednesday May 20 at 2:40 pm until 3:00 pm on ‘The Practicalities of Measuring Fast Switching/Transient Currents in Power Electronic Applications Using Rogowski Transducers’.
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