Next-generation network tester NG+

With the updated, next-generation Network Tester NG+, GOEPEL electronic relies on the high-performance Series 62 platform to meet current and future technology requirements.

In order to cover the broadest possible spectrum of applications, the new NG+ system architecture supports classic bus systems, such as CAN-FD, CAN-SIG, LIN, and FlexRay, as well as the latest Automotive Ethernet (AETH) standards - 10BASE-T1S, 100BASE-T1, and 1000BASE-T1. In addition, the system is prepared for future trends such as CAN-XL.

"Our aim in network test is to determine whether a control unit sends and receives data in accordance with specifications under all possible operating conditions in the vehicle. This allows us to simulate and test whether the control unit complies with the standard or whether it impairs communication within the vehicle environment. With our new generation of network testers, previous test scenarios can be optimised and at the same time the focus can be placed on state-of-the-art requirements," says Senior Team Manager Michael Schmidt from GOEPEL electronic.

In terms of interface design, the scalable NG+ family is suited for individual tests as well as network/integration tests. This is made possible by an optional NG+ extension system, which facilitates tests with a high number of interfaces - including, for example, domain controller ECUs or complete vehicle assemblies. A necessary core feature is the time synchronisation between the systems and their physical parameters across the various interfaces. Backed by a snapshot logging function for all test-relevant communication interfaces and real-time-capable event/action handling, a wide variety of test tasks can be realised. As in the previous version, the system also features stress and trigger modules for CAN-FD, LIN, and FlexRay.

The automation and implementation of the test cases according to manufacturer specifications is carried out using AUTOSAR-conformant tool chains, whereby ECU-specific test sequences are compiled from generic templates. The resulting test reports facilitate fault analysis and can be processed by higher-level data management systems as needed.