National Instruments Announces 2010 Automated Test Outlook

14th April 2010

NI-Emerson

ES Admin

0 0

National Instruments announced the availability of its 2010 Automated Test Outlook report, which shares findings of the company’s research into innovations and technologies shaping today’s test and measurement applications. The business and technology insights presented in the outlook apply across many industries including communications, aerospace and defence, semiconductor, automotive and consumer electronics. The goal of the 2010 Automated Test Outlook is to help engineers and managers gain further insight into the cross-industry trends impacting their organisations.

The extensive understanding of technology trends that National Instruments has gained through its interaction with companies across many sectors provides a unique vantage point on the direction of the test and measurement market. The 2010 Automated Test Outlook combines input from academic research, business intelligence, user surveys, online forums, customer advisory board feedback and field sales discussions. With this data as its foundation, the report builds a broad representation of the next generation of trends and methodologies addressing the business and technical challenges in test and measurement.

The 2010 Automated Test Outlook is organised into five categories: Business Strategy, Architectures, Computing, Software and I/O. Within each of the five categories, the report details a trend, methodology or technology impacting test and measurement. Topics that the 2010 report discusses are listed below:

-- Standardisation: Developing a common test platform reduces costs and increases reuse throughout the product life cycle
-- Multichannel RF Test: Testing next-generation wireless devices requires a highly synchronised parallel test architecture from signal to software
-- Peer-to-Peer Computing: Increasingly complex testing requirements require higher performance and point-to-point computing architectures
-- Embedded Design and Test: Real-time test software helps engineers reuse tests alongside their embedded system models throughout the development process
-- Reconfigurable Instruments: Field-programmable gate array (FPGA)-based instruments deliver a new level of performance and flexibility by facilitating reconfigurability down to the hardware

To view the 2010 Automated Test Outlook, readers can visit www.ni.com/ato.