National Instruments and TSSI Collaborate to Support WGL and STIL Semiconductor Vector Formats

“Our collaboration with National Instruments unites our semiconductor design-to-test solutions with NI automated test controller technology and helps us both meet the needs of semiconductor test engineers,” said Dave Karpenske, senior vice president for sales and marketing at TSSI. “We believe our expertise in test vector translation and validation software is a natural fit with NI and its innovative contributions to the semiconductor industry through modular, cost-effective platforms like PXI.”

The WGL and STIL vector formats commonly are used by engineers to run tests on semiconductor devices during the characterization, design validation and production test phases of product development. These vectors are generated by electronic design automation (EDA) tools and used to stimulate a fabricated device to verify that its physical implementation matches the results achieved in simulation. The vectors are applied using digital test equipment with capabilities similar to the NI PXI-6552 100 MHz digital waveform generator/analyzer with features such as per-cycle tri-stating, onboard vector comparison and clock data delay. The new TSSI TD-Scan for National Instruments software eliminates the custom programming previously required to make these vectors work on NI instrumentation by automatically converting the WGL and STIL vectors to native file formats for NI digital test equipment.

“Working with TSSI helps National Instruments expand our delivery of more innovative products to the semiconductor characterization and test market,” said Scott Savage, semiconductor market development manager at NI. “We are excited to work with TSSI, a global leader in design-to-test solutions, and we anticipate being able to provide our customers enhanced design-to-test integration because of this new time-saving product.”

By making it possible for engineers to use the vector outputs from EDA software in validation and production tests on NI digital test equipment, the TSSI TD-Scan for National Instruments software significantly increases the efficiency and flexibility of this test process. Engineers now can read and manipulate WGL and STIL vectors in LabVIEW and the NI Digital Waveform Editor, both of which provide control for all NI digital test hardware.

To view a webcast detailing how the new TSSI TD-Scan for National Instruments software integrates with NI PXI instrumentation, readers can visit www.ni.com/semiconductor.