Measurement option aids 5G device verification

The solution, which integrates a new differential noise figure option into the Anritsu VectorStar vector network analysers (VNAs), allows R&D engineers to verify the receiver performance of low noise amplifiers (LNAs) and other devices used in the front-end of 5G and microwave back haul systems.

The option is available on VectorStar models operating from 70kHz and up to 20GHz, 40GHz, 70GHz, and 110GHz.

It enhances the 2-port single-ended noise figure measurement capability of the VectorStar and allows the VNAs to measure 3- and 4-port devices in single-ended, differential and common mode operation with a variety of processing options.

It also incorporates the similar cold-source measurement technique as its 2-port method, which minimises mismatch errors for improved accuracy compared to the conventional Y-factor noise source method, and it adds the ability to perform levels of vector correction in 2- and multi-port devices for greater accuracy particularly, when mismatch is significant.

Measurement analysis of both correlated and uncorrelated noise can be conducted with the new differential noise figure technique. The result is more comprehensive characterisation of actual device performance for greater design confidence.

It is a superior method than conventional approaches that include an RF balun with only an S-parameter description or neglect correlation between device under test (DUT) output ports, which lead to improper characterisation of differential devices.

As operating frequencies continue to rise due to 5G, the ability to more accurately characterise device performance will take on added importance.

Accuracy is further ensured by the extended range of network tools for VectorStar.

For example, the VNAs have the ability to embed or de-embed single-ended and differential probes and other networks during the on-wafer noise figure measurement process and correct receiver calibrations for other setup changes.

The result is more accurate noise figure characterisation of differential devices in an on-wafer environment.