LeCroy's 3 GHz Serial Data Analyzers are for Real Time Analysis of High-Speed Serial Data

The LeCroy SDA3010 integrates all the key tests into one device: eye patterns with violation locator, accurate and repeatable jitter analysis, precision numerical clock recovery with adjustable PLL response, bit error analysis, 1 ps jitter noisefloor, and compliance testing for a broad range of standards.

A wide range of target applications include computer/component, design/validation, testing of high- speed differential electrical links and capture/analysis of optical signals. The Windows-based SDA3010 is designed with a unique user interface that makes the measurement process easy and incorporates LeCroy’s patented X-StreamTM technology allowing engineers to conduct real time analysis even on high-speed, complex data rates.

The SDA3010 features a 20 GS/s sampling rate, very low trigger jitter (3 ps), long acquisition memory up to 50 Mpts and comes standard with Q-Scale Jitter View, the ASDA-J Jitter Analysis Package and 8B/10B Decoding Option. The SDA3010 user-selectable 50 Ω and 1 MΩ input terminations is unique in a 3 GHz oscilloscope and makes it well suited for routine general-purpose measurements.

As new standards are being developed, specialized measurements are often needed. Using the powerful customization features of the SDA, specialized parameters and functions can be implemented using MATLAB®, Mathcad®, Excel, VisualBasic, or any other programming language. These functions can then be embedded into the instrument, creating custom measurements that can be accessed in the same manner as any of the standard features of the instrument.

ASDA-J is the first jitter solution that can evaluate total jitter, as well as random (Rj) and deterministic (Dj) jitter, using both reference-clock-based and non-clock-based methods. ASDA-J not only provides the industry’s most accurate solution for measuring both optical and electrical serial data signals but also allows for measurement correlation with time interval analyzers (TIAs) and sampling oscilloscopes. With the ASDA-J solution,a single SDA can perform the same measurements that previously required a real-time digital oscilloscope, TIA, sampling oscilloscope, and bit error rate tester (BERT).

The result is a single-instrument solution for jitter that can produce significant time and cost savings. ASDA-J enables the SDA3010 to correlate its jitter measurements with both sampling oscilloscope and TIA-based instruments.

First introduced in real-time serial data analyzers by LeCroy, the new Q-Scale view shows a graphical representation of key jitter components. It is a powerful tool for the engineer troubleshooting the source of jitter in circuits.

The SDA-8B10B protocol decoding software package provides the ability to analyze an encoded data stream and view the physical layer signaling associated with those data streams. Users can simultaneously view the physical layer waveform and the symbolic content of that waveform on one convenient display. A powerful search feature allows captured waveforms to be searched for user-defined sequences of symbols. Certain serial data standards transmit and receive data in multiple lanes. The ability to apply decoding to up to four simultaneous captured channels allows for multi-lane analysis that is not possible with single channel solutions.