Test & Measurement
LeCroy launches new 13 GHz Oscilloscope
LeCroy Corporation announces the launch of a new 13 GHz Test Solution for next generation serial data standards. Comprised of the SDA13000 Serial Data Analyzer, the D13000PS Active Differential Probe, and a suite of innovative debug and analysis tools, LeCroy’s system goes beyond compliance testing to provide the most powerful methods for next generation serial data bus design, development and debug available today. With a bandwidth of 13 GHz, a sample rate of 40 GS/s, and 100 Mpts/ch memory; LeCroy’s SDA13000 troubleshoots challenging physical layer problems during development, and delivers the perfect solution for compliance testing of next generation serial data standards.
“EInnovative Tools for Next Generation Serial Data Compliance and Debug
The SDA13000 and D13000PS enable compliance and debug testing on next generation serial data standards covering memory, storage, and computing applications. The computing industry is the primary driver behind the need for faster memory technology, faster disk drive storage, and a faster interconnect technology to link them together. Memory demands have driven transfer rates to 800 MT/s, as provided by DDR II and FB-DIMM. Storage demands in the computing industry have increased greatly due to increases in server and large storage capacity, which are met by SAS II, SATA II, and Fibre Channel technologies. The latest emerging technology is PCI-Express Gen 2, which functions as a high speed interconnect between the CPU and its peripherals. PCI-Express Gen 2 is primarily used in servers, workstations, PC’s, laptops, and mobile devices. The 13 GHz system bandwidth of the SDA1300 and D13000PS is an outstanding compliance solution that also offers advanced debug tools to help engineers solve the most complex design problems. LeCroy has designed both the compliance and debug tests to be easy to set up and use with an integrated pll (phase locked loop) specifically for PCI-Express, FB DIMM, and Fibre Channel. The debug tools include and eye violation locator and ISI (Inter-symbol Interference) plot to understand which bit or bit combination is contributing the most errors. Other tools include PJ (periodic jitter) breakdown feature to help the engineer understand which frequency is contributing the most periodic jitter to the total jitter. Features such as Eye Doctor, WaveScan and 8b/10b decode and search capabilities further enhance the SDA13000’s serial data solutions.