/> The LeCroy SDA 825Zi-A Serial Data Analyzer and oscilloscope models provide two input channels at 25 GHz – ideal for capturing the fifth harmonic of 10 Gb/s NRZ serial data. The SDA 825Zi-A may also be used in a four channel 20 GHz mode with exceptional signal fidelity – in fact, it is the only oscilloscope that provides 25 GHz with two input channels and 20 GHz with four input channels. This flexibility in bandwidth and input channel count is beneficial when the test engineer needs both the ability to perform a crosstalk analysis between multiple lanes using cable inputs and also to measure with the highest signal fidelity possible for validation of jitter performance on a single differential lane using cable inputs. Differential probes with bandwidth ratings up to 25 GHz are also available for use with the SDA 825Zi-A.

The SDA 825Zi-A comes standard with SDA II Serial Data Analysis Software, 32 Mpts/ch of memory, a hardware serial data trigger, and a variety of other standard software packages commonly used in serial data analysis, debug, and validation.
Oscilloscope Bandwidth Upgradeability and Investment Protection

LeCroy offers solutions for higher bandwidth in both SDA 8 Zi-A and LabMaster 9 Zi-A platforms. SDA 8 Zi-A can be upgraded to up to 45 GHz in bandwidth. LabMaster 9 Zi-A allows up to 20 channels at 20 GHz, 10 channels at 30 GHz, and 5 channels at 45 GHz. LabMaster provides unique capabilities in the marketplace for multi-lane serial data jitter and crosstalk analysis. Both solutions – 8 Zi-A or 9 Zi-A can grow in bandwidth to accommodate future testing challenges.
SDA II Serial Data Analysis Software Provides Superior Analysis Capabilities

SDA II Software – unique to LeCroy – provides faster eye diagram analysis (up to 100x faster), two jitter decomposition methods (for better debugging of crosstalk issues), and more jitter analysis tools (for deeper insight into root cause issues). The SDA II analysis package is the only solution that fully integrates jitter measurements into the oscilloscope software for greater confidence in jitter measurements.

The IsoBER eye analysis feature included in SDA II adds insight to the traditionally non-quantitative view of eye openings by providing an extrapolated view of the eye opening for a user-adjustable bit error rate. The ability to Show Mask Failures helps to quickly identify sources of eye failures by pinpointing the failure location in the acquisition data. Understanding root causes of the Random Jitter (Rj) and Deterministic Jitter (Dj) in a serial data waveform is a crucial step in reducing overall jitter, and LeCroy provides exceptional capability in this regard. For example, the Periodic Jitter (Pj) Spectrum allows the user to accurately identify the frequencies where Pj occurs. The Data Dependent Jitter (DDj) Histogram displays the distribution of the DDj while simultaneously showing a plot of the DDj vs. time overlaid on the pattern. Deep understanding of InterSymbol Interference (ISI) is enabled with a view of the ISI in sum or separated by a specific pattern. These analysis tools provide the highest level of insight into possible jitter causes and are not available from other vendors.
SPARQ Signal Integrity Network Analyzer - Fast, Easy, Affordable

The SPARQ provides S-parameter measurements with one button push at a fraction of the price of a conventional Vector Network Analyzer (VNA). The SPARQ signal integrity network analyzer connects directly to the device under test (DUT) and to PC-based software through a single USB connection for quick, multi-port (up to 12) S-parameter measurements. S-parameter measurements have traditionally been made using a VNA, a difficult to use instrument that is beyond many budgets. SPARQ is very affordable and simplifies measurements, making S-parameters accessible at the desktop of the Thunderbolt engineer.

The SPARQ provides calibrated measurements with a single connection to the DUT and offers simple setup choices. The user is able to start and complete the entire measurement with a single button press. Calibration standards are built into the SPARQ, which enables measurements to be made without multiple connection steps and removes the need for additional electronic calibration (ECAL) modules. Calibration proceeds quickly without user intervention, so calibration can be done often without relying on out-of-date saved calibrations.

SPARQ is the ideal instrument for characterizing multi-port Thunderbolt devices. It is ideal for development of measurement-based simulation models, design validation, compliance testing, or as a high-performance TDR.
Eye Doctor II Provides Easy Integration of S-Parameter Files into Serial Data Analysis

SPARQ provides S-parameter Touchstone format files that can be easily inserted into Eye Doctor II for embedding/de-embedding, and emulation. In addition, Eye Doctor II permits user-control for addition or removal of pre- or de-emphasis in transmitter signals, and also permits the ability to emulate the hardware equalizer used in the receiver so as to allow eye diagram and jitter calculations for the Thunderbolt signal as seen by the receiver.
PeRT3™ Provides Protocol Awareness for High Speed Serial Data Testing

LeCroy’s introduction of PeRT3 has changed the dynamics of physical layer testing. The PeRT3 fills the space between physical layer test and protocol test, providing a new and more intelligent capability for performance testing of receivers and transmitters. PeRT3 Phoenix specifically addresses PCI Express Gen3 test requirements. For other standards, LeCroy has incorporated PeRT3 together with LeCroy oscilloscopes and software for end-to-end testing of high speed serial data standards.

As Thunderbolt evolves and specifications become finalized, LeCroy will ensure support for Thunderbolt adopters through a continuous process of product upgrades and new product additions.