Test & Measurement

Compliance test application characterises LPDDR4 designs

8th January 2015
Mick Elliott
0

Keysight Technologies introduced a complete compliance test application for systems using low-power double-data-rate 4 memory. The application gives engineers an efficient and quick way to characterise LPDDR4 designs. In addition to testing and validating designs to ensure compliance with the LPDDR4 JEDEC JESD209-1 standard, the application offers offline testing support for running signals from simulation tools like Keysight’s Advanced Design System.

The Keysight N6462A DDR4 and LPDDR4 test application, which runs on Keysight Infiniium 90000A, 90000 X-Series and Z-Series oscilloscopes, provides LPDDR4 physical-layer compliance measurements. Signal access is provided by Keysight’s LPDDR4 BGA probes.

LPDDR4 is a type of dynamic random-access memory technology optimized for embedded and mobile applications. With its low power requirements, the technology is ideal for mobile devices such as smart phones. LPDDR4 DRAM, with data rates up to 4266 MT/s, is 50 percent faster than current LPDDR3 DRAM.

The LPDDR4 compliance test application is designed for engineers who develop smart phones, tablets, gaming consoles and other consumer electronics. The N6462A provides automated testing capabilities for clock, electrical, timing and eye diagram tests. The N6462A LPDDR4 application automatically configures the oscilloscope for each test and generates an HTML report at the end of the test. The report compares the results with the specified test limit and indicates how closely the device passes or fails each test.

To complement its LPDDR4 solutions, Keysight offers LPDDR4 BGA probing solutions to provide the LPDDR4 signal accessibility needed to perform physical-layer characterisation, protocol analysis and compliance tests. The N6462A LPDDR4 compliance test integrates InfiniiSim and PrecisionProbe tools to enable de-embedding, which removes probing effects, thereby improving measurement accuracy.

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