Keithley Publishes E-Handbook on Nanoscale Electrical Measurements

A free copy is downloadable upon request from Keithley at: http://www.keithley.com/pr/087.

The e-handbook is divided into several topic areas:

* Nanotech Testing Challenges
* Electrical Measurement Considerations
* Electrical Noise
* Source-Measure Instruments
* Pulsing Technologies
* Avoiding Self-Heating Problems

In addition to these topics, the e-handbook provides insights on graphene, the single-atom-thick crystal of carbon, thought by many to be the semiconductor industry’s eventual replacement for silicon. A useful glossary of low-level measurement terminology and a guide to selecting instruments suitable for nanotechnology applications are included. In addition, links to a variety of webinars, white papers, and application notes relevant to each topic area are included.

Keithley instrumentation is helping advance the state of the art in a growing list of nanotechnology applications. Six decades of experience in designing ultra-sensitive measurement tools allow Keithley to provide university, corporate, and government labs around the world with solutions for investigating new material and device properties. Keithley partners with organizations like the Institute of Electrical and Electronics Engineers (IEEE), leading Nanotechnology Centers of Excellence, customers, and other leading nanotechnology measurement tool vendors to create more complete nano test solutions. The insight into emerging needs provided by these working partnerships helps Keithley deliver new capabilities faster.