Test & Measurement

Keithley Introduces Measurement How-To Library on CD

15th February 2007
ES Admin
0
Keithley Instruments, Inc., a leader in solutions for emerging measurement needs, has released the Simplified Test Toolkit, an interactive tutorial CD that helps test engineers overcome tough measurement challenges. The CD offers a collection of useful technical seminars to help engineers in creating more powerful and effective yet simple test and measurement applications.
The technical seminars in the Simplified Test Toolkit CD are informative and easy-to-understand and cover topics such as:

Software-Defined Radio Architecture and Next-Generation RF Instrumentation Meeting New Challenges in Wafer Level Reliability Testing Making Successful Electrical Measurements on Nanoscale Materials and Devices Advances in Testing: The Advantages of On-Board Test Sequencing

The Simplified Test Toolkit CD also includes technical presentations on Keithley's powerful test and measurement systems, including the Series 2600 SourceMeter® Instruments, the Model 4200-SCS Semiconductor Characterization System with Pulse I-V capabilities, Series 3400 Pulse/Pattern Generators, and the Models 2810 RF Vector Signal Analyzer and 2910 RF Vector Signal Generator. Users can also request individualized configuration assistance from Keithley's application engineers, as well as a quote on any of Keithley's test and measurement products or systems.

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