Free Keithley Web-Based Seminar Explores New Measurement Techniques and Capabilities for Testing Flash Memory

During this webinar, fundamentals of FLASH technology testing will be reviewed, incorporating a discussion of Fowler-Nordheim (FN) and Hot Electron Injection (HEI) programming and erasing. Different aspects of testing applicable to single FLASH transistors and FLASH array testing will be considered, including standard transistor characterization, endurance, and disturb testing. The pulse fidelity requirement for MLC testing will also be discussed. These applications will be demonstrated via Keithley's new Ultra Fast I-V test solution, which offers better control of the pulse shape and amplitude, and, as a result, is well-suited for MLC FLASH testing, and also Keithley's ACS software, which manages a range of testing scenarios.

New Methods for Testing FLASH Memory is recommended for people with established FLASH test setups, as well as those looking for a test solution.

This seminar will be presented by Alex Pronin, a lead applications engineer with Keithley Instruments, Inc. in Cleveland, Ohio. Pronin holds a Master’s Degree in Physics from the Moscow Institute of Physics and Technology and a Ph.D. in Material Science from Dartmouth. He has been with Keithley since 1996.

Registration Information.

New Methods for Testing FLASH Memory will be broadcast on Thursday, May 20, 2010 at 15:00 CEST (9:00 a.m. EDT) for the European audience and at 2:00 p.m. EDT for the North American audience. The event is free to the public, but participants must register in advance at www.keithley.com/events/semconfs/webseminars. The seminar will also be archived on Keithley’s website for those unable to attend the original broadcast.