Test & Measurement
ASSET’s new JTAG-based embedded debugger diagnoses Intel x86 systems anywhere, anytime
A new embedded debugger from ASSET InterTech (www.asset-intertech.com), the leading supplier of tools for embedded instrumentation, is the first in-system JTAG-based debugger for Intel® x86 platforms.
BaseReferred to as the ScanWorks embedded diagnostics solution, the debugger firmware operates out of an x86-based circuit board’s service processor, which is sometimes referred to as the Baseboard Management Controller (BMC) and may be implemented in a field programmable gate array (FPGA) on the board. The ScanWorks embedded diagnostics solution is able to access the Intel x86 processor through its debug port to diagnose faults and failures in the system. Some of the typical debugger functions provided by ScanWorks embedded diagnostics include reading and writing to all x86 registers, to memory, and to I/O interfaces; setting and retrieving breakpoints; and single-stepping through code.
Because ScanWorks embedded diagnostics is deployed as intellectual property (IP) within working systems, it can perform powerful debugging routines in the lab or in the field, anywhere, anytime, and on an unlimited number of systems where it has been embedded. This functionality is invaluable for troubleshooting problems with the system’s device drivers, BIOS (Basic Input/Output System), operating system kernel, and catastrophic or intermittent hardware or software failures that might cause system crashes or hangs.
“Being able to debug the root cause of intermittent system failures in the field is a critical capability for high-availability systems,” said Alan Sguigna, vice president of sales and marketing for ASSET. “ScanWorks embedded diagnostics is able to identify the causes of problems that often seem impossible to debug, such as the dreaded ‘blue screen’ system crash or a kernel panic.”
One of the early adopters of ScanWorks embedded diagnostics was Cray Inc., which is integrating it into next-generation, high-availability supercomputers to ensure a high level of system reliability.
“ASSET’s ScanWorks platform provides a rich set of functionality for embedded diagnostics,” said Peg Williams, senior vice president of research and development at Cray. “ScanWorks-based solutions will enable Cray’s next-generation product development to maintain a focus on quality and reliability, while continuing to push the envelope in scalability. This is a real differentiator for Cray’s next-generation supercomputers and we believe it will give us a competitive advantage in the marketplace.”