Test & Measurement

Anritsu to Demonstrate LTE Tester Using LG Device at MWC

15th February 2010
ES Admin
0
Anritsu Corporation is to give a demonstration of its LTE tester using LG Electronics’ (LG) LTE USB Modem at the Mobile World Congress (MWC) in Barcelona, which is being held from February 15 to 18, 2010.
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LTE is a next-generation, high-speed mobile wireless technology scheduled to commence operation among the world’s leading operators from this year. Anritsu has been working with LG, as a primary test vendor, to verify that LG’s products are LTE-capable.



The tests carried out so far have achieved excellent results. Already, Anritsu has successfully tested LG’s LTE modem in radio frequency conformance test cases, as well as confirming high-speed data throughput of up to 100 Mbps (downlink) and 50 Mbps (uplink). LG has also obtained TELEC certification, a regulatory requirement under Japan’s Radio Law, using the Anritsu TELEC system.



At the MWC, Anritsu will be demonstrating LG’s LTE modem with its LTE signaling tester, which comprises the MD8430A and the Rapid Test Designer (RTD). The RTD is Anritsu’s multi-technology development-test scripting tool, employing a flow-chart-based test development that is rapidly becoming the global standard.



Anritsu plans to continue its work in verifying LG devices using system tests, GCF/PTCRB conformance test cases and in ensuring compatibility with the leading LTE networks.



LTE Exhibits



* MD8430A LTE Signaling Tester (e-NodeB Simulator)

* RTD Rapid Test Designer (test script editing and execution software)

* ME7832L LTE Protocol Conformance Test System

* ME7873L LTE RF Conformance Test System

* MT8820C Radio Communication Analyzer

* MS2830A Signal Analyzer

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