Anritsu Expands LTE Field Test Instrument Portfolio

The LTE RF measurement option allows users to accurately and quickly validate the RF quality and performance of LTE signals. It can also help field technicians troubleshoot RF problems associated with LTE signals. With the LTE modulation quality measurement option, Error Vector Magnitude (EVM), frequency error, and Control Channel power tests can be conducted. When the Spectrum Master analyzers are equipped with the OTA option, users can validate the over-the-air performance of the complete eNode-B system, as well as troubleshoot problems with the LTE signal. The OTA option can also be used to verify/validate LTE signal coverage with the instruments’ scanner functionality.

Designed for Use with Handheld Analyzers Covering the 100 kHz to 6 GHz frequency, the MS2712E/MS2713E handheld spectrum analyzers deliver superior interference analysis capabilities and the ability to assess signal quality across a broad range of increasingly complex RF signals. They can locate difficult-to-detect interfering signals – including both intermittent and continuous ones – resulting from the proliferation of wireless systems and an ever-crowding RF spectrum. The instruments have dynamic range of >95 dB, DANL of -152 dBm in 10 Hz RBW, and typical phase noise of -110 dBc/Hz max @ 10 kHz offset at 1 GHz. Unlike competitive instruments, the Spectrum Master delivers a small, compact, cost-effective, intuitive, easy-to-use solution with superior interference analysis capabilities, phase noise, dynamic range, and sweep speed performance.