Test & Measurement
Agilent Technologies New AFM 6000ILM Seamlessly Integrates Atomic Force and Light Microscopy
Agilent Technologies announced the availability of the Agilent 6000ILM AFM, a new atomic force microscopy (AFM) platform. The 6000ILM AFM is a state-of-the-art research solution that seamlessly integrates the capabilities of an AFM with those of an inverted light microscope or an inverted confocal microscope. The 6000ILM AFM lets life science researchers go beyond the optical diffraction limit to achieve nanoscale spatial resolution with unprecedented ease of use.
The For ultimate ease of use, the 6000ILM uses a computer-controlled laser with automated photodetector alignment and offers simple point-and-shoot AFM imaging based on the optical image. A high-stability, precision motorized stage directs the movement of the sample beneath the AFM tip for measurement. Researchers can use off-the-shelf 0.55NA condensers to perform fluorescence or DIC imaging, simultaneously with AFM imaging, to quickly create high-precision overlays of the resultant images. The 6000ILM facilitates high-resolution topography and mapping, the ability to collocate points of interest sequentially, and the acquisition of more detailed information about a sample's structure and material property domains.
The 6000ILM supports a wide variety of scanning probe microscopy imaging modes, including Agilent's patented magnetic AC mode (MAC Mode) for unrivaled in-liquid imaging. Additional 6000ILM advantages include Agilent's innovative PicoTREC, for real-time molecular recognition imaging, as well as force spectroscopy, for experiments such as protein unfolding. Furthermore, the unique design of Agilent sample plates provides superior stability and easy sample loading. Heating control is available from ambient to 80 C with 0.1 C precision.