Agilent Technologies - Oscilloscopes with Big Display, Hardware-Accelerated Search and Navigate Capability

Electronic design and test teams in nearly every electronic industry, including computer, communications, semiconductor, aerospace/defense, automotive and wireless industries, continue to produce increasingly sophisticated hardware designs. Designers use oscilloscopes as the primary tool to test and debug those designs. Agilent's InfiniiVision 7000B Series oscilloscopes offer the best signal visibility to designers who employ digital control signals or serial bus communication schemes



Benefits of the Agilent InfiniiVision 7000B Series oscilloscopes include:



* Biggest display: All InfiniiVision 7000B Series models are equipped with a biggest-in-class 12.1-inch display -- nearly 40 percent more display area than any other scope on the market. The increased display size helps users display up to 20 channels simultaneously with serial protocol.

* Fastest update rate: InfiniiVision 7000B Series models provide the industry's fastest sustained update rate -- up to 100,000 waveforms per second -- eliminating two common errors that can cause engineers to miss critical information. These issues include unresponsive controls with deep memory turned on, and traditional architectures that are blind to changes in the signals being tested. For designs with both digital and analog signal measurements, the update rate is 5,000 times faster than any other available scope. This fast update rate allows users to view critical signal detail that competitive scopes miss with their longer dead times.

* Most comprehensive suite of applications: In addition to their numerous general-purpose features, InfiniiVision 7000B Series oscilloscopes can be equipped with a number of unique software options to shorten debug cycles. Optional software packages include:

* hardware-accelerated serial decode, lister and trigger for MIL-STD 1553, I2 S, I2C, SPI, CAN, LIN, FlexRay, RS-232 and other UARTs with search and navigation capability;

* rapid core-assisted debug of designs with Xilinx or Altera FPGAs;

* segmented memory for analysis of laser pulses, radar bursts and serial packets;

* mask testing with hardware-acceleration, which allows engineers to test waveforms to specified standards in seconds instead of hours;

* offline PC viewing and sharing of previously acquired scope data; and

* RF contextual viewing of scope data using vector signal analysis software.