Agilent Technologies' Atomic Force Microscope Chosen by Imperial College of London

The Agilent 5500 AFM has been optimized to perform precision electrical measurements, in particular, high-spatial-resolution Kelvin force microscopy (KFM) and current sensing. The 5500 also allows high-resolution topographic and phase imaging, as well as offering exceptional environmental control for testing samples under various environmental conditions.

We are thrilled that Dr. Anthopoulos has chosen to utilize Agilent AFM instrumentation, noted Jeff Jones, operations manager for Agilent's nanoinstrumentation facility in Chandler, Ariz. Dr. Anthopoulos' research is paving the way for the development of novel organic, inorganic, and hybrid semiconductor systems and cost-effective, high-performance electronic and optoelectronic devices. We look forward to providing him with the state-of-the-art tools and technologies needed to further his work. In particular, we are very excited about the opportunity to support his use of advanced KFM techniques perfected by Dr. Sergei Magonov on the Agilent 5500.

Among Dr. Anthopoulos' ongoing projects are the development of ambipolar organic field-effect transistors; air-stable complementary and complementary-like integrated circuits; light-sensing transistors and integrated optoelectronic circuits; and organic nanoscale channel transistors and integrated circuits. Additional ongoing projects include graphene-based electronic and optoelectronic devices; self-assembling molecular nanodielectrics; and the study of charge-carrier dynamics in organic semiconductors and devices.

We are very excited about the possibilities that the Agilent 5500 AFM system will enable, especially in our research for novel high-performance semiconducting materials and devices, said Dr. Anthopoulos. The high-spatial-resolution Kelvin force microscopy and current sensing capabilities of the system combined with its excellent environmental control will allow study of the electronic and structural properties of these novel material systems and devices down to nanometer scale.