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Test & Measurement

Aeroflex's DC to 40 GHz SMART^ET 5300 Reduces Life Cycle Cost of High-performance, High-speed RF and Microwave Testing

3rd February 2010

Aeroflex Test Solutions

ES Admin

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For high-performance, high-speed testing of RF and microwave devices, Aeroflex introduces the SMART^E 5300 general-purpose test environment. The DC to 40 GHz SMART^E 5300 is unique in its ability to test, monitor, and control any Device Under Test (DUT) within a single test environment.

“SMART^E™ 5300 eliminates a large rack of test equipment and replaces it with a compact test system that is quickly reconfigured and redeployed to suit any individual DUT or production line,” said Dr. Francesco Lupinetti, senior business development executive for Aeroflex’s High Speed Test Solutions. “The SMART^E™ 5300 also has the ability to emulate legacy and obsolete instruments. In this market, long-term support is a major concern. The fact that we can offer customers a ‘future-proof’ system gives customers peace of mind.”

SMART^E™ 5300 is designed for parametric and functional testing in the military/aerospace and high-performance commercial markets. The system is ideal for customers with one or more of these demanding RF/microwave test requirements:

· High throughput production;
· Large number of unique tests per DUT;
· Highly repetitive tests per DUT;
· Product lines requiring rapid software reconfiguration of test systems;
· Replacement of racks of older or obsolete equipment with a “synthetic” or software-defined test environment.

The SMART^E™ 5300 is the highest performance, lowest life cycle cost, turnkey synthetic test environment for general purpose RF/microwave parametric and functional testing. Its many features reduce complexity and result in extending the life cycle of test environments.

· With open system architecture and a highly intuitive user interface, customers can easily write and program new tests and test sequences.
· Third-party modules and instruments are added easily, while system-level software allows easy integration.
· Complete software measurement libraries allow quick set-up for turnkey functional and parametric testing.
· System-level calibration ensures that all modules and instruments are fully integrated and perform highly accurate, coherent and repetitive, NIST traceable measurements right up to the interface of the DUT.
· Diagnostic software allows local and remote troubleshooting to the module or instrument level.
· All hardware modules and interfaces are based on widely used industry standards including PXI, LXI, cPCI, Ethernet, etc. Standard software interfaces are exercised through a full-featured Test Executive and National Instruments’ TestStand™ engine.