Power supply unit extends memory IC test options

14th March 2014

Mick Elliott

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Advantest has extended its V93000 capabilities with the DPS128HV module, a high-density device power supply (DPS) unit designed to handle a wide range of operating voltages for testing devices such as eFlash memory ICs. With the new module, Advantest’s V93000 test platform can be easily scaled from low-channel to high-channel configurations to provide the most economical test solution for each specific device under test.

V93000 configurations equipped with the new module are capable of testing up to 1,024 independent sites in parallel, achieving multi-site efficiency (MSE) as high as 99.9 percent. In a small A-Class or C-Class configuration, the module offers very high density to perform cost-effective testing over many power domains. The module’s wide voltage range of -6V to 15V at 200Mamps maximises flexibility, making it suited for a broad spectrum of applications including eFlash, negative charge pump and one-time programmable memory (OTP).

On all of its 128 independent voltage/current (VI) resources with four-wire kelvin connections, the module achieves superior accuracy. To maximise throughput it can operate under full sequencer control. This allows the system to perform pattern-synchronised testing to generate highly repeatable, accurate measurements at high speeds. To increase the supply current, multiple channels can be ganged.

The unit can conduct voltage and current profiling as well as control its slew rates. Testing of analogue interfaces is performed using an 18-bit digitiser and a 16-bit arbitrary waveform generator.

The DPS128HV module is now available as an upgrade or on V93000 testers shipped from the factory.