Search results for "oscilloscopes"

Agilent Technologies today introduced the industry's lowest-priced USB 2.0 signal-quality test option. This option for the InfiniiVision 4000 X-Series oscilloscopes supports low-speed, full-speed and hi-speed USB applications. The USB interface is used extensively for computer applications and for a broad range of embedded connectivity applications.

Agilent Technologies have today announced the expansion of its award-winning Infiniium 90000 X-Series oscilloscope family to include the world’s highest performance mixed-signal oscilloscope, or MSO. The expansion adds six new MSO models, as well as 13-GHz DSO and DSA models, to the X-Series. Engineers and developers use MSOs to accelerate testing by employing the additional trigger flexibility for debugging and validating their devices.

Tektronix today announced a new Serial Data Link Analysis Visualizer software package (SDLA Visualizer) for Tektronix performance oscilloscopes including the DPO/DSA/MSO70000 Series. Designers working on next generation high-speed serial standards can use SDLA Visualizer to specify their link, de-embed any components from the measurement path, simulate virtual link components, apply equalization and take measurements at multiple points on the tra...

National Instruments introduce the NI PXIe-5162 digitizer and updates to the LabVIEW Jitter Analysis Toolkit. The digitizer, with 10 bits of vertical resolution and a 5 GS/s sample rate, provides high-speed measurements at four times the vertical resolution of a traditional 8-bit oscilloscope. With 1.5 GHz of bandwidth and four channels in a single slot, the NI PXIe-5162 is suited for high-channel-count digitizer systems in manufacturing test, re...

Agilent introduce the Infiniium 9000 H-Series high-definition oscilloscopes. The four new models come in bandwidths of 250 MHz, 500 MHz, 1 GHz and 2 GHz. They offer up to 12-bit vertical resolution, which represents 16 times the quantization levels of traditional oscilloscopes with 8 bits of resolution. These scopes also include the industry’s deepest standard memory (up to 100 Mpts per channel).

Peter J. Pupalaikis, Vice President of Technology Development at Teledyne LeCroy, has been named an IEEE Fellow. He is being recognized for contributions to high-speed waveform digitizing instruments. Mr. Pupalaikis' design efforts and inventions have provided for large increases in the performance of real-time waveform digitizers leading to the production of the world's fastest oscilloscopes. These instruments are essential to electronic enginee...

Tektronix today announced a new series of high-speed pattern generators and error detectors to support optical and serial data communications testing on signals as fast as 32 Gb/s. The new PPG3000 Series Pattern Generators and PED3000 Series Bit Error Detectors feature multi-channel pattern generation with channel-specific data programming ideal for critical margin testing on critical standards like 100G Ethernet, which require up to 4 channels.

Agilent today introduce the industry's first embedded multimedia card compliance test application for embedded storage solutions. The Agilent N6465A eMMC test application helps memory design engineers validate and debug eMMC NAND flash memory cards faster by automating the execution of a series of parametric tests, including electrical and timing measurements, on Agilent Infiniium 9000, 90000A, 90000 X- and 90000 Q-Series oscilloscopes.

A new white paper from ASSET InterTech points out how increasing bus speeds on circuit boards could create havoc for signal integrity on those buses, in turn degrading the bus’ throughput performance. Each new generation of a high-speed bus typically runs at a higher signal frequency, but this decreases the margin for error on the bus, making it more sensitive to disruptions from jitter, inter-symbol interference, crosstalk and other factors.

Tektronix today introduced the TBS1000 Series of entry-level oscilloscopes, giving electrical engineers, educators and hobbyist an affordable, dependable and full-featured tool for a wide variety of general purpose electronics test applications.