Search results for "tektronix"
Tektronix Arbitrary/function generators from TTi
Now available from TTi (Thurlby Thandar Instruments) is the Tektronix AFG3000 Series of arbitrary/function generators, consisting of six models with the market-leading 240 MHz, dual-channel, 2 GS/s AFG3252 at the head of the series.
Oscilloscopes from TTi offer serial triggering and analysis
Now available from TTi, the Tektronix DPO3000 Series is a family of lower-cost mid-performance oscilloscopes incorporating the long record length needed for serial data analysis in embedded systems. All DPO3000 models incorporate a 5 megasample record length on each channel and can sample at up to 2.5 GS/s on all channels simultaneously. Two- or four-channel models are available with bandwidths of 100 MHz, 300 MHz or 500 MHz.
Agilent Introduces Tektronix-to-Agilent Probe Adapter, Expands Oscilloscope Value
Agilent today introduced a Tektronix-to-Agilent probe adapter. The N2744A T2A adapter enables engineers to connect Tektronix TekProbe-BNC Level 2 probes to Agilent's Infiniium and InfiniiVision oscilloscopes.
National Instruments and IET to host Conference and Exhibition at NIDays 2006
National Instruments UK & Ireland is hosting NIDays 2006, its popular, annual professional development conference for engineers, in association with the IET (Institution of Engineering and Technology), at the home of the IET, Savoy Place, on Tuesday 31st October 2006. Hundreds of engineers, scientists and industry experts from across the UK and Ireland will gather at this free, one-day multi-track event to learn how the latest developments in co...
National Instruments to Host the Online Automated Test Summit 2008
National Instruments has announced the fifth annual Automated Test Summit, an online event featuring technical sessions focused on identifying trends and overcoming challenges in automated test. The Automated Test Summit 2008 will be hosted live on the Internet on June 5 and will be presented in the Americas, Europe and Asia, giving attendees the opportunity to speak with experts in various languages. At the free full-day event, attendees can vie...
LeCroy Enhances LogicStudio to Include Tektronix and Agilent Oscilloscope Connectivity
LeCroy Corporation today announced a new version of its LogicStudio software that enhances the oscilloscope connectivity of the LogicStudio™ 16 providing support for not only the LeCroy WaveJet® oscilloscope but also several popular oscilloscopes from Tektronix and Agilent. This new software adds an unprecedented level of flexibility to the LogicStudio, letting users of a wide range of oscilloscopes from 40 MHz up to 1 GHz turn their PCs into ...
National Instruments Simplifies Instrument Control with LabVIEW and Industry’s Largest Source of Drivers
National Instruments simplifies instrument control by offering the NI Instrument Driver Network (IDNet), said to be the industry’s largest source of instrument drivers, and easy-to-use software optimised for instrument control including NI LabVIEW, LabWindows/CVI and Measurement Studio for Microsoft Visual Studio.
Software-Defined Test Reaches the Tipping Point in Military and Aerospace Applications
At the 3rd annual National Instruments Military & Aerospace Solutions Conference held at the Systems Engineering Innovation Centre at Loughborough University, keynote speakers Ian Bell and Darcy Dement introduced conference delegates from across the military and aerospace industry in the UK & Ireland to the “Tipping Point”. The concept was first introduced by Malcolm Gladwell in his book of the same name published in 2000. To quote the autho...
National Instruments to Showcase Latest in Automated Test & Control Design at NI Military/Aerospace Solutions Conference 2007
Military and aerospace engineers can learn more about the latest developments in automated test and control design at the National Instruments Military and Aerospace Solutions Conference on Tuesday 22nd May 2007. Taking place at the System Engineering Innovation Centre, University of Loughborough, this free one-day conference and accompanying exhibition features technical demonstrations and case studies of the latest technologies for virtual and...
Free Keithley Web-Based Seminar Explores Source Measurement Instrumentation
Keithley Instruments, Inc. will broadcast a free, web-based seminar titled “What is an SMU Instrument, and How Do You Decide Which One is Right for Your Application?” on Thursday, February 23, for participants in North America and on Thursday, March 1, for those in Europe. This one-hour seminar will address how source measurement unit (SMU) instruments work, describe key features and capabilities to consider when selecting them, and compare t...