Search results for "oscilloscopes"
Updated transmitter features SNDR measurement
An update for Tektronik PAM4 solution for validating 400G physical layer transmitter designs for its DPO70000SX ultra high performance oscilloscope series, has been made. The release adds PAM4 error detection, SNDR (Signal to Noise and Distortion Ratio) measurement capability, and advanced FFE/DFE equalisation capabilities into one solution.
PAM4 error detection enhances oscilloscope series
An update to its PAM4 solution for validating 400G physical layer transmitter designs for its DPO70000SX ultra high-performance oscilloscope series is announced by Tektronix. The latest release adds PAM4 error detection, industry-leading Signal to Noise and Distortion Ratio (SNDR) measurement capability, and new advanced FFE/DFE equalisation capabilities into one easy to use solution.
Standard LAN interface adds allure for budget conscious DSO buyers
The model 2190E bench digital storage oscilloscope (DSO) replaces the 2190D in the B&K Precision portfolio. Offering the same measurement capabilities as the 2190D, the 2190E continues to add more features to the entry-level 100MHz DSO. New upgrades include a higher resolution display and standard LAN interface at no additional cost.
Automated USB 3.1 Type-C test solution offers deep analysis
An automated USB 3.1 Type-C transmitter test solution for Gen1 and Gen 2 that combines full SigTest support with DPOJET debug and analysis tools, allowing designers to bring devices with improved margins to market in less time has been announced by Tektronix. The new solution delivers 100 percent compliance test coverage as well as full support for the new Type-C connector, fixtures and associated channel tests.
PXI oscilloscope delivers 100Vpp maximum input range at 1GS/s
The PXIe-5164 oscilloscope just released by NI is built on the open, modular PXI architecture, and includes a user-programmable FPGA to help aerospace/defense, semiconductor and research/physics applications that require high-voltage measurements and high levels of amplitude accuracy.
Probe measures signal variations on a DC power/voltage rail
Two products have been launched by Teledyne LeCroy: the RP4030 active voltage rail probe and a MIPI System Power Management Interface (SPMI) serial decoder. The RP4030 probe measures small signal variations on a DC power/voltage rail, while the SPMI decoder monitors and correlates SPMI serial bus messages with DC power/voltage rail changes.
SPMI decoder combines with oscilloscope for power integrity test
Two new products, the RP4030 active voltage rail probe and an industry first MIPI System Power Management Interface (SPMI) serial decoder have been launched by Teledyne LeCroy. The RP4030 probe measures small signal variations on a DC power/voltage rail, while the SPMI decoder monitors and correlates SPMI serial bus messages with DC power/voltage rail changes.
Oscilloscopes CAN FD support meets automotive demand
A complete CAN FD protocol trigger, decode and search solution has been added to the Tektronix MDO3000 and MDO4000C Series of mixed domain oscilloscopes. It will help automotive engineers meet consumer demand for more capable and sophisticated electronic modules and integrated systems.
PSI5 bus support added to oscilloscopes range
Peripheral Sensor Interface 5 (PSI5) bus analysis has been added by Yokogawa on its 8-channel DLM4000 and 2 and 4 channel DLM2000 oscilloscopes making them useful for automotive designers and engineers. The Peripheral Sensor Interface 5 (PSI5) is a widely used open standard based interface for in-vehicle communications in the automotive industry and a key application area is in the control of Air Bags.
Oscilloscope probes measure voltages in the millivolt range
The new R&S RT-ZP1X passive 1:1 probe from Rohde & Schwarz broadens the application range of its R&S RTO and R&S RTE series oscilloscopes. Both the probe and the oscilloscopes' frontend are extremely low noise, making this combination ideal for measuring the smallest of signals down to 1 mV/div, e.g. for power integrity measurements on integrated circuits and components.