Search results for "rohde"
Phase noise analyser enhanced up to 50GHZ
The latest model of the R&S FSPN phase noise analyser and VCO tester from Rohde & Schwarz extends the frequency range for measurements from the previous maximum of 26.5 GHz up to 50 GHz.
Click rate measurements meet latest CISPR standard
Rohde & Schwarz says that the R&S EPL1000 now adds click rate measurements in line with the latest CISPR 14-1:2020 version, mandatory for household appliances and electric power tools.
Duo collaborate to verify UWB PHY layer test
Rohde & Schwarz and Samsung have collaborated to verify secure ranging test cases for the ultra-wideband (UWB) PHY layer and assess the secure receiver characteristics of devices based on FiRa specifications.
EEI compliance test to be demoed at MWC 2024
Rohde & Schwarz has partnered with SmartViser, a provider of active test automation products, to develop a tailored solution for testing compliance with a new EU Energy Efficiency Index (EEI) label for smartphones and tablets.
Rohde & Schwarz promotes Pauly to Executive Board
Rohde & Schwarz has named Andreas Pauly (pictured) to its Executive Board. He becomes President and Chief Technology Officer to concentrate on R&D projects, while maintaining a focus on test and measurement equipment.
Wi-Fi 7 test solution features at MWC 2024
At Mobile World Congress 2024 in Barcelona (February 26-29), Rohde & Schwarz will be showcasing its latest Wi-Fi 7 test solutions for R&D and production to meet the ever-increasing test challenges posed by the technology and the parallel operation with LTE and 5G cellular standards.
Date set for Demystifying EMC conference
Rohde & Schwarz will host its annual Demystifying EMC (DEMC2024) industry event on February 6, 2024.
Rohde & Schwarz joins European microelectronics project
To strengthen the semiconductor industry in Europe, the European Commission announced the IPCEI (Important Project of Common European Interest) at the beginning of June, enabling funding of around 100 European projects.
Duo combine for wireless BMS test enhancement
A new automated test solution, developed by Analog Devices (ADI) and Rohde & Schwarz is tailored for verification and mass production tests of wireless device tests.
Duo join for radar sensor reference design verification
A radar target simulator from Rohde & Schwarz has been used to verify the performance of NXP Semiconductors’ next-generation radar sensor reference design.