Search results for "tektronix"

National Instruments will join fellow industry leaders including Agilent, Anritsu, Tektronix, QualiSystems and Yokogawa, at the New Electronics Test & Measurement Design Day. Taking place at Reading’s Madejski Stadium on Thursday 15th May 2008, the one day conference and exhibition will focus on next generation test solutions, covering three technology based streams: wireless test, embedded test and software related issues.

National Instruments has released the industry’s highest bandwidth PXI digitiser, complementing the rapidly expanding suite of performance instrumentation available in PXI.

Francis Griffiths, a National Instruments employee for the past eighteen years, is one of eight long term members of NI staff to be promoted to Vice President. After graduating with a B Eng (Hons) Electrical and Electronic Engineering from University of Wales Institute of Science and Technology in Cardiff, Griffiths joined National Instruments UK & Ireland in 1989, shortly after the Branch opened, as an Applications Engineer on the NI Engineerin...

National Instruments is hosting the fourth annual Automated Test Summit, featuring technical sessions focused on identifying trends and overcoming new challenges in automated test. The Automated Test Summit 2007 will be hosted live on the Internet May 8, and will be available on demand for 90 days. At the free full-day event, attendees can view keynote presentations, watch technical sessions, participate in live Q&A forums and interact with vendo...

Engineers, scientists and educators involved in test and measurement, industrial control and automation, and embedded design are invited to attend NIDays 2009, the annual professional development conference, hosted by National Instruments UK & Ireland. This renowned industry event is held in association with the Institution of Engineering and Technology, (IET) and media partners Electronics Manufacture & Test, The Engineer and New Electronics, o...

The ElectroTestExpo consortium is pleased to announce that National Instruments has joined the growing ElectroTestExpo community and will be exhibiting at the Cambridge event – at the Trinity Centre on the Cambridge Science Park on Wednesday 23rd May. The company will also be giving a presentation as part of ElectroTestExpo’s seminar programme. Entitled ‘Customising Measurements and Analysis with PXI and FPGA Technology’, the presentation...

Tektronix announced that validation of ASICs designed in IBM’s 8HP silicon germanium (SiGe) BiCMOS Specialty Foundry technology are exceeding target specifications for a planned new performance oscilloscope capable of greater than 30 GHz bandwidth across multiple channels while minimizing noise found in older chip sets.

Tektronix, Inc has announced the availability of the TDS1000B and TDS2000B Series of digital storage oscilloscopes. With up to 200 MHz bandwidth, 2 GS/s maximum sample rate per channel, USB flash and device ports, and the industry’s first lifetime warranty, the 2- and 4-channel TDS1000B and TDS2000B Series oscilloscopes are designed to simplify configuration, testing and documentation for design and test engineers and are said to offer unprec...

Tektronix has announced the introduction of an ultra-high performance oscilloscope with 20 GHz real-time bandwidth and 50 GS/s simultaneous sampling rate. The DSA70000 Digital Serial Analyzer (DSA) oscilloscope family includes several new models – 20 GHz DSA72004, 16 GHz DSA71604 and 12.5 GHz DSA71254.

Tektronix has announced its RSA-IQWIMAX demodulation and analysis software, part of a comprehensive test set to find and solve WiMAX design problems. RSA-IQWIMAX software is a new application specific test tool for characterizing and troubleshooting WiMAX device designs utilizing a Tektronix RSA3408A Real-Time Spectrum Analyzer and is the result of a partnership between Tektronix and LitePoint. With RSA-IQWIMAX and the RSA3408A, engineering tea...