Search results for "spectrum instrumentation"
Nexperia now offer GaN FETs in compact SMD packaging CCPAK
Nexperia has announced that its GaN FET devices, featuring next-gen high-voltage GaN HEMT technology in proprietary copper-clip CCPAK surface mount packaging, are now available to designers of industrial and renewable energy applications.
Mouser stocks Qorvo Wi-Fi 7 front-end modules
In stock at authorised distributor Mouser Electronics are the Wi-Fi 7 front-end modules (FEM) from Qorvo.
Reshaping 3D electronics for AI hardware
A new advancement in computer chip technology has emerged from collaborative research led by Sang-Hoon Bae, an assistant professor at the McKelvey School of Engineering, Washington University in St. Louis.
IEDM 2023: a convergence of innovation in electron devices
From the 9th to the 13th of December 2023, the 69th Annual IEEE International Electron Devices Meeting (IEDM) will convene at The Hilton San Francisco Union Square, offering a unique platform for professionals in semiconductor and electronic device technology.
IAR announces new version with enhanced Cloud debugging and simulation capabilities
IAR has unveiled version 9.50 of its flagship offerings: IAR Embedded Workbench for Arm and IAR Build Tools for Arm.
Strategic partnership accelerates EV powertrain design with virtual prototyping
Hexagon’s Manufacturing Intelligence division and JSOL Corporation have entered a strategic partnership to accelerate the virtual prototyping of electrified powertrains through multi-physics simulation.
ST Edge AI Suite accelerates adoption with comprehensive ecosystem offer
STMicroelectronics has announced the ST Edge AI Suite, a free integrated software toolkit to accelerates Edge AI adoption.
IBM and Meta launch the AI Alliance
IBM and Meta have jointly launched the AI Alliance, a coalition uniting over 50 founding members and collaborators from various sectors globally.
New Grid-EYE – 90° from Panasonic
Panasonic Industry has launched a new member of its Grid-EYE sensor family featuring a 90° lens delivering a wider FoV and reducing the number of sensors required to cover a given area to enable people counting and tracking applications.
OTA test system wins CTIA Certification
Rohde & Schwarz says its R&S TS8991 over-the-air (OTA) test system is the first to be approved by CTIA Certification for testing 5G A-GNSS antenna performance.