Search results for "Averna"
NIWeek 2010 to Explore Technologies for Gaining Competitive Advantages
National Instruments has announced plans for NIWeek, the world’s leading graphical system design conference and exhibition that attracts more than 3,300 engineers, scientists and members of the academic community. NIWeek 2010, the company’s 16th annual technology conference, opens Aug. 3 at the Austin Convention Centre in Austin, Texas, for three days filled with targeted summits and tracks, technical sessions, interactive demonstrations and ...
National Instruments to Host Automated Test Summit 2007
National Instruments is hosting the fourth annual Automated Test Summit, featuring technical sessions focused on identifying trends and overcoming new challenges in automated test. The Automated Test Summit 2007 will be hosted live on the Internet May 8, and will be available on demand for 90 days. At the free full-day event, attendees can view keynote presentations, watch technical sessions, participate in live Q&A forums and interact with vendo...
Hyundai Motors Selects Averna's RF Record and Playback System to Test Receiver Performance Globally
Averna announced today that Hyundai Motors has selected Averna’s RF Record and Playback system to verify the performance of its infotainment receivers.
National Instruments Hosts Virtual Automated Test Summit in Europe
National Instruments is hosting the first online Pan-European Automated Test Summit, which features technical sessions on identifying trends and overcoming new challenges in automated test. The Pan-European Automated Test Summit is a free, full-day event hosted live on the Internet on Nov. 27 at 9am GMT. During the summit, attendees can view keynote presentations, watch technical sessions, participate in live Q&A forums and interact with vend...
National Instruments to Host the Online Automated Test Summit 2008
National Instruments has announced the fifth annual Automated Test Summit, an online event featuring technical sessions focused on identifying trends and overcoming challenges in automated test. The Automated Test Summit 2008 will be hosted live on the Internet on June 5 and will be presented in the Americas, Europe and Asia, giving attendees the opportunity to speak with experts in various languages. At the free full-day event, attendees can vie...
National Instruments Adds Instrument-Class I/O to LabVIEW FPGA Hardware
National Instruments has introduced a new family of open, FPGA-based hardware for the PXI platform. The NI FlexRIO product family is the industry’s first commercial off-the-shelf (COTS) solution to provide engineers with the flexibility of NI LabVIEW FPGA technology combined with high-speed, instrument-class I/O. With NI FlexRIO, engineers can add custom signal processing algorithms to their PXI-based field-programmable gate array (FPGA) hardwa...
National Instruments Hosts Virtual Automated Test Summit in Europe
National Instruments is hosting the first online Pan-European Automated Test Summit, which features technical sessions on identifying trends and overcoming new challenges in automated test. The Pan-European Automated Test Summit is a free, full-day event hosted live on the Internet on Nov. 27 at 9am GMT. During the summit, attendees can view keynote presentations, watch technical sessions, participate in live Q&A forums and interact with vendors ...
Averna accelerates design phase and shortens production cycle for Sumitomo, USA
Averna, test solution leader for optics technologies, today announced that Sumitomo Electric Device Innovations, USA Inc (SEDU) has selected Proligent® Analytics to streamline its product design and testing operations for optical components such as XFP transceivers, which will help improve their time-to-market.
NIWeek 2009 will Examine ways to Developing Applications Faster and More Cost-Efficiently
National Instruments has announced plans for NIWeek, its graphical system design conference and exhibition that attracts more than 3,000 engineers, educators and scientists. NIWeek 2009, the company’s 15th annual customer and technology conference, running Aug. 4-6 at the Austin Convention Center in Austin, Texas, provides three full days of technical sessions, hands-on workshops, targeted summits and interactive exhibitions on the latest devel...
National Instruments Announces Plans for NIWeek 2011
National Instruments has announced plans for NIWeek, the world’s leading graphical system design conference and exhibition that attracts more than 3,000 of the world’s most innovative engineers, educators and scientists. NIWeek 2011, the company’s 17th annual technology conference, takes place from August 2 to 4 at the Austin Convention Center and inspires attendees to explore cutting-edge technologies such as the use of graphical system de...