Search results for "matter"
CCE’s EnSuite updated with useful features for Manufacturing Support and Supply Chain
CCE announced today that it has added several key capabilities in the latest update of EnSuite version 2.2 – its flagship software for sharing detailed product knowledge across the extended enterprise, with ease. “We are very excited at the latest EnSuite update that comes packed with productivity tools for people in Manufacturing Support and Supply Chain job functions”, says CCE’s V.P. of Sales & Marketing, Mr. Vinay Wagle. He adds, “T...
Keynote Named for 2009 Collaboration & Interoperability Event
Longview Advisors, organizers of the annual 3D Collaboration & Interoperability Conference and Exhibition, announced today the keynote speaker for the 2009 event (www.3Dcic.com), to be held May 18-20 in Estes Park, Colorado.
New Megapixel Telecentric And Macro Zoom Lens
The new TEC-V7X lens from Computar offers dual functionality. Designed for use with high resolution cameras up to 5 megapixels with 1/1.1 inch image sensors, this versatile lens operates both as a 7X macro zoom lens with 0.07X to 0.5X magnification and as a telecentric lens within the 0.25X to 0.5X magnification range. It provides excellent brightness throughout the zoom range, maintaining 70% illumination at both centre and corners.
WIRELESS LOCKS – ACCESS CONTROL FROM EMKA
The EMKA Agent E range represents a new approach to the electronic lock solution for cabinet security comprising a unitary electronic release swing handle with battery power – so simplifying installation while enabling either individual radio key unlocking or central operation. This radio-controlled swing handle program does not need hard wiring and may be installed on individual cabinets or large applications with many suites of cabinets.
Rustins Limited builds product line of specialty paints using X-Rite technology
When a potential customer asked if Rustins Limited could accurately recreate an entire line of more than 150 specialty paints for hobbyists, the U.K.-based paint and stain manufacturer responded with a resounding yes.
Carter Manufacturing Limited Achieves Aerospace Quality Management Standard AS9120
Carter Manufacturing Limited is pleased to announce that it has been awarded certification to AS 9120-B, the quality management standard specifically developed for the aviation, space and defence industries.
netJACK Connectivity Solution Delivers Flexible Networking
Hilscher has launched a family of network interface modules called netJACK, to quickly and easily add or change fieldbus and Industrial Ethernet protocols in automation devices. Thirteen different protocols are supported, including fieldbuses, such as DeviceNet and PROFIBUS, and Industrial Ethernet protocols, such as EtherCAT, Ethernet/IP and PROFINET, in both master and slave versions.
TRIPLE COMBINATION
One laser for two different machines, this is the concept behind the new TruMatic 3000 Fibre punch/laser combination machine. It shares a fibre-guided TruDisk laser with the TruLaser Robot 5020 cell in the TRUMPF LaserNetwork, an arrangement that significantly increases the utilization rate of the beam source.
Food-grade compressed air for the sweet side of life
Optimisation of the production processes in the Alfred Ritter GmbH & Co.KG required an improvement in compressed air quality. The problem was clearly defined: Compressed air for the pneumatic handling of cereals, cocoa powder and other primary matters in the production of chocolate had to be in accordance with the strict requirements of the HACCP concept. This concept is a preventive system which ensures the safety of food for consumers. Devel...
Mixed-Signal Interconnect Solution for Semiconductor Device Probers and Characterization Equipment from Keithley
Keithley Instruments has introduced what it says is the test industry’s only cabling solutions capable of handling I-V, C-V, and pulsed I-V signals with a single set of cables (patent pending). The new cabling kits are based on a patent-pending design that speeds and simplifies the process of making DC Current‑Voltage (I‑V), Capacitance‑Voltage (C‑V), and pulsed I‑V testing connections from any modern semiconductor...