Search results for "Sfera labs"

Cree, Inc. announces the commercial availability of TEMPO Services, a comprehensive set of quantitative and qualitative tests and analyses for LED-based lighting fixtures and lamps. TEMPO (Thermal, Electrical, Mechanical, Photometric and Optical) Services represent the accumulated advantage of Cree’s extensive experience with customer LED systems combined with the use of calibrated test equipment to give LED lighting manufacturers and end users...

InfoLink Process Historian from Canary combines several software packages, including Canary’s Trend Historian and Trend Link software, Software Toolbox’s symbol library, and optional XLReporter from SyTech, to provide a real-time and historical view of a process. With just a few keystrokes, an operator can call up historical data from any point in the past, and review trends, HMI screens and reports exactly as they occurred.

XMOS, the creator of Software Defined Silicon, has announced the shipment of 300 development kits in the two months following their introduction. Take-up of the XMOS development kits has been worldwide, covering a diverse range of users and a broad spectrum of applications, from networked audio and LED display panel control through to industrial automation. Two-thirds have gone to commercial users, a third to research and academia.

Keithley Instruments has enhanced its popular ACS Basic Edition software, adding support for a broader line of source-measure (SMU) instrumentation. This broader choice of compatible instruments should prove especially useful in expanding the software’s voltage and current limits available for testing solar cells, photovoltaic panels, and discrete power semiconductors. ACS Basic Edition combines high speed hardware control, device connectivity,...

Keithley Instruments has introduced what it says is the test industry’s only cabling solutions capable of handling I-V, C-V, and pulsed I-V signals with a single set of cables (patent pending). The new cabling kits are based on a patent-pending design that speeds and simplifies the process of making DC Current‑Voltage (I‑V), Capacitance‑Voltage (C‑V), and pulsed I‑V testing connections from any modern semiconductor...

Keithley Instruments introduced the Model 4225-PMU Ultra Fast I-V Module, the latest addition to the growing range of instrumentation options for the Model 4200-SCS Semiconductor Characterization System. It integrates ultra-fast voltage waveform generation and current/voltage measurement capabilities into the Model 4200-SCS’s already powerful test environment to deliver the industry’s broadest dynamic range of voltage, current, and rise/fall/...

Keithley Instruments has introduced a variety of enhancements for its award-winning Model 4200-SCS Semiconductor Characterization System. The Keithley Test Environment Interactive V8.2 upgrade includes new non-volatile memory test libraries and sample projects for a variety of emerging memory technologies. The upgrade also supports making very low frequency capacitance-voltage measurements, which are useful for characterizing device technologies ...

Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has published an informative e-handbook titled “Ensuring the Accuracy of Nanoscale Electrical Measurements.”

Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has published an informative poster on nanotechnology measurement tips and techniques.

TESEQ has officially opened a new office in Taipei City. Headquartered in Switzerland, this global developer and provider of instrumentation and systems for EMC emission and immunity testing, has again expanded its reach in Asia. TESEQ recognises the unique business environment facing Taiwan customers and the distinct opportunities and competitive conditions it presents. With offices on both sides of the border in Taipei and Beijing, TESEQ is str...