Search results for "tektronix"
Parametric test solution targets power semiconductors
The Keithley S540 Power Semiconductor Test System, a fully-automated, 48 pin parametric test system for wafer-level testing of power semiconductor devices and structures up to 3kV has been released by Tektronix. Optimised for use with the latest compound power semiconductor materials including silicon carbide (SiC) and gallium nitride (GaN), the fully integrated S540 can perform all high voltage, low voltage, and capacitance tests in a single pro...
Training link helps debug data centre interconnects
A new 100G link training tool has been released for use with the Tektronix DPO7000SX family of ultra-high performance oscilloscopes. This new option, along with expanded measurement support for 100G electrical debug and validation, addresses critical needs in the growing data centre market.
Oscilloscopes CAN FD support meets automotive demand
A complete CAN FD protocol trigger, decode and search solution has been added to the Tektronix MDO3000 and MDO4000C Series of mixed domain oscilloscopes. It will help automotive engineers meet consumer demand for more capable and sophisticated electronic modules and integrated systems.
Distributor extends design and test products selection
The Electronics Workbench web page has been updated by RS Components. The page – which serves engineers designing circuit boards, working in PCB manufacturing, or carrying out electronics test and measurement – features relevant DesignSpark articles and discussions, best-practice advice from industry leaders and the very latest products, equipment and innovations.
Tektronix to showcase innovative technology solutions at electronica
Tektronix will be showcasing a wide range of applications, from IoT, power analysis, education and research, semiconductor design and RF test at electronica 2016 (Stand 438, Hall A1), which takes place from 8-11th November in Munich.
Signal analyser targets radar/EW design
A wideband signal analysis solution that combines 800MHz of real-time bandwidth with up to 2 hours of streaming storage at full bandwidth in one solution has been announced by Tektronix. The new RSA7100A instrument’s 16kHz to 26.5GHz frequency range covers a broad range of analysis needs for critical wide-bandwidth applications.
Software paves way to repeatable material characterisation
A complete solution for performing high resistivity measurements in compliance with accepted industry standards including ASTM D257 and IEC 60093 has been unveiled by Tektronix. Designed for use with the Keithley Model 6517B Electrometer and Model 8009 Resistivity Chamber, the new Model KICKSTARTFL-HRMA application automates volume and surface resistivity measurements for more accurate and repeatable results without the need for custom programmin...
Test solution meets ONFI flash memory standard
What is claimed to be the industry’s first test solution for the Open NAND Flash Interface (ONFI) standard is available for Tektronix high-performance oscilloscopes. The ONFI 4.0 test solution includes software for analysing DDR2/3 modes on the ONFI bus coupled with an effective probing solution based on interposers.
DisplayPort Type-C transmitter test solution cuts compliance test times
A DisplayPort Type-C Transmitter Test solution significantly reduces compliance test times compared to both previous Tektronix DisplayPort solution and those available from competitors. According to real-world field evaluations, the highly optimised solution for use with Tektronix high-performance oscilloscopes allows engineers to complete the full suite of DisplayPort Type C compliance tests in less than 6 hours.
Tektronix enhances Optical Modulation Analyser Software
Tektronix announced a series of enhancements to its optical modulation analyser (OMA) software. The latest release provides optical research engineers with the ability to evaluate multi-channel coherent modulation schemes with confidence using a single measurement system. Engineers can now calibrate and control multiple OMA’s to easily acquire and analyse simultaneous data from multiple channels such as different wavelengths or fiber cores.