Search results for "6G"

KYOCERA AVX, a global manufacturer of advanced electronic components engineered to accelerate technological innovation and build a better future, is exhibiting at CES 2023, which will take place 5–8 January in Las Vegas.

MediaTek has that it has completed interoperability testing for Automated Frequency Coordination (AFC) on MediaTek Filogic Wi-Fi 7 and Wi-Fi 6E chips, in collaboration with Federated Wireless.

MediaTek will be demonstrating a full ecosystem of production-ready devices featuring the next generation of wireless connectivity at CES 2023.

The journey to 6G is moving forward, and to push research further forward Keysight Technologies demonstrated a solution to test components such as transceiver amplifiers and antenna at 250GHz to 300GHz. Jean Pierre Teyssier, Research Engineer at Keysight Technologies expanded on the solution to Mick Elliott, Editor at Electronic Specifier at European Microwave Week.

While the rollout of 5G is still in its infancy, bleeding-edge research around the world is now heavily focused on solving a significant problem that is expected to arise within the next few years.

At European Microwave Week 2022 (EuMW) in Milan, Rohde & Schwarz will showcase a compact, user-friendly solution for D band signal generation and analysis with excellent signal performance.

Greenliant is now shipping mSATA and SATA M.2 2242 ArmourDrive EX Series solid state drives (SSDs) with EnduroSLC Technology for data retention and endurance ranging from 60K and 120K to 300K program-erase (P/E) cycles.

Electronic Specifier takes a look at the top power products to have been released in December 2022.

At the recent i14y Lab Open RAN services and platforms PlugFest, which was part of the O-RAN ALLIANCE Global PlugFest Fall 2022, Rohde & Schwarz and VIAVI Solutions have combined their capabilities to deliver an integrated solution for conformance testing of O-RAN Radio Units (O-RUs).

Fairview Microwave has broadened its line of high-power switches engineered to guarantee high reliability for test-and-measurement and transmit-and-receive applications.