Search results for "vector informatik"

Keithley Instruments has announced that ip.access, a developer of femtocell and picocell solutions, has purchased Keithley’s award-winning Radio Frequency (RF) test solutions. ip.access has selected Keithley’s Series 2800 RF Vector Signal Analyzers and Series 2900 RF Vector Generators as the solution for its production testing of WCDMA femtocell base stations.

The Yokogawa WT1800 precision power analyser is the latest addition to the company's highly successful range of digital power measuring instruments. Replacing the WT1600, an industry standard for many years, the WT1800 offers innovative measurement functions which benefit the engineer with electrical power and efficiency measurements in a range of industries from inverter and drive design to alternative energy systems.

Kontron today announced the support of the quad-core 3rd generation Intel Core i7-3615QE (4x2.3GHz, 6MB L2 cache) and i7-3612QE (4x2.1GHz, 6MB L2 cache) processors on seven embedded computing platforms, to match the market demands for ever increasing power savings and performance gains.

A new range of low-priced 802.11 WiFi test systems is now available in the UK from TTi (Thurlby Thandar Instruments Ltd), the exclusive UK distributor for GaGe Applied Technologies. The NEXUS turnkey wireless testing systems provide all the signal generation and analysis hardware and software required for complete testing of 802.11 a, b, g, j, and n wireless devices.

The second MOST Forum took place on March 23rd, 2010, in Frankfurt, Germany. 150 professionals from the automotive electronics industry and academia participated in the very informative conference and visited the accompanying exhibition. The broad international audience was composed of attendees from Europe as well as India, Japan, South Korea, and the United States.

Agilent Technologies will demonstrate how its wide array of high-speed digital tools can address multi-gigabit design challenges in the areas of measurement and simulation. Attendees can connect with Agilent experts at DesignCon, Booth 301, from Feb. 1-4, 2010 at the Santa Clara Convention Center.

Agilent announced it will demonstrate the latest wireless test and measurement solutions at CTIA WIRELESS 2010, March 23-25, Las Vegas Convention Center, Booth 2427. Agilent's test solutions address the latest wireless technologies, including LTE, TD-LTE, 3GPP W-CDMA, HSPA+, E-EDGE (EDGE Evolution), UMA/GAN, WiMAX™, and femtocells.

Agilent Technologies announced that its Scanning Microwave Microscopy Mode (SMM Mode) has been named one of 10 2009 Prism Award winners by judges from SPIE and the advisory board of Laurin Publishing's Photonics Spectra magazine.

Agilent today announced the availability of key enhancements to its 89600 Vector Signal Analysis (VSA) software which is used by cellular communications and wireless networking R&D engineers around the world.

Agilent Technologies announced it will demonstrate the latest LTE test application solutions at the LTE World Summit 2010, May 17 - 19, in Amsterdam, at the Hotel Okura, Booth 30.