Search results for "Sfera labs"
Thermo Fisher Scientific to Unveil Major New LIMS at PITTCON 2010
Thermo Fisher Scientific Inc., will unveil a new LIMS solution within booth 2757 at PITTCON 2010, being held from February 28-March 5 at the Orange County Convention Center in Orlando, Fla. Under the theme Connecting all of Science, the company will also showcase innovative new analytical instruments, software and laboratory workflow solutions that comprise its Thermo Scientific brand.
Thermo Fisher Scientific Introduces EQuan MAX, an Automated High Throughput LC-MS Solution for Water and Beverage Analysis at ASMS 2010
Thermo Fisher Scientific Inc.,announces the launch of the Thermo Scientific EQuan MAX an automated high throughput Liquid Chromatography-Mass Spectrometry (LC-MS) solution for the analysis of contaminants in water and beverages. This innovative system with high resolution and accurate mass (HRAM) boasts new screening and quantitative capabilities that provide enhanced system flexibility and productivity. This solution will be displayed at the S...
New miniature valves reduce energy consumption by 75 percent for use in medical equipment
In addition to piloting larger valves and controlling pneumatic automation systems, where they proliferate, small solenoid valves also perform a huge number of tasks hidden in devices that dispense, analyse, or process fluids in small quantities; anything from a lab sample analyser to a vending machine.
Bunkspeed presents ”CGI Made Simple” at SIGGRAPH 2008
Bunkspeed today announced its schedule of promotional events for SIGGRAPH 2008. Now in its 35th year, the premier international conference for the computer graphics community takes place August 12-14 in Los Angeles, and is expected to draw an estimated 30,000 professionals from six continents.
Arc-Flash-Analytic v3.0 has been granted 100% CLEAN Softpedia award.
Arc-Flash-Analytic v3.0 software for arc flash hazard analysis has been tested in the Softpedia labs using several industry-leading security solutions and found to be completely clean of adware/spyware components.
X-Rite launches NetProfiler 3.0 software to maintain accuracy and consistency of spectrophotometers across workflows, from design through product realization
Company introduces next generation of popular software for customers using handheld spectrophotometers in industrial and graphic arts markets
Giga-tronics Receives $1.1 Million Order from the U.S. Navy for its Model 8003 Precision Scalar Analyzers
Giga-tronics Incorporated announced that it received a $1.1 million order from the Naval Air Warfare Center in Lakehurst New Jersey for its Model 8003 Precision Scalar Analyzer. The Giga-tronics Model 8003 Precision Scalar Analyzer combines a 90 dB dynamic range with the accuracy and linearity of a power meter in a single instrument. John Regazzi, CEO of Giga-tronics stated, We are committed to supporting the US Navy’s long term requirement fo...
Mixed-Signal Interconnect Solution for Semiconductor Device Probers and Characterization Equipment from Keithley
Keithley Instruments has introduced what it says is the test industry’s only cabling solutions capable of handling I-V, C-V, and pulsed I-V signals with a single set of cables (patent pending). The new cabling kits are based on a patent-pending design that speeds and simplifies the process of making DC Current‑Voltage (I‑V), Capacitance‑Voltage (C‑V), and pulsed I‑V testing connections from any modern semiconductor...
Keithley Upgrades SCS For Solar Cell Testing, Expanded C-V Frequency Range, and Nine-Slot Chassis Support
Keithley Instruments has introduced a variety of hardware, firmware, and software enhancements to its award-winning Model 4200-SCS Semiconductor Characterization System. The Keithley Test Environment Interactive (KTEI) V7.2 upgrade includes nine new solar cell test libraries, an expanded frequency range for the system’s Capacitance-Voltage (C-V) measurement capability, and support for the company’s new nine-slot Model 4200-SCS instrument chas...
Keithley Earns Metrology Reaccreditation, is Among the First Labs to Earn New U.S. Accreditation
Keithley Instruments has announced that its Metrology Services department has achieved renewal of its ISO 17025 accreditation, having successfully completed a rigorous three-and-a-half-day ISO 17025 re-accreditation assessment by A2LA (American Association for Laboratory Accreditation). As part of the A2LA assessment, Keithley has also been successfully accredited to the new ANSI/NCSL Z540.3-2006 American standard. The scope of Keithley’s accre...