Search results for "data storage"
SCD unveils Mini Blackbird 1280 HFM
SCD has announced the launch of its latest off-the-shelf product, the Mini Blackbird 1280 HFM. This detector represents a significant advancement in electro-optic capabilities for SCD.
“Lowest power consumption” MEMS accelerometer
The ADXL367 from Analog Devices is an ultralow power, 3-axis microelectromechanical systems (MEMS) accelerometer that consumes just 0.89 μA at a 100 Hz output data rate and 180 nA when in motion-triggered wake-up mode.
Software upgrade benefits engineers and line operators
XJTAG has released version 4.0 of its software suite, bringing speed increases both from streamlining the user interface and from increasing throughput of the JTAG chains under test.
The evolution of military optronics
ODU presents pioneering connection solutions for demanding inserts in military optronics applications.
PICMG announces COM-HPC Mini Academy event
PICMG, the consortium driving open standards for modular, scalable computing, will be hosting a COM-HPC Mini Academy on Tuesday, 4th June at 14:00 UTC.
Next-generation network tester NG+
GOEPEL electronic offers solutions for validating the network compliance of control units with its next-generation network tester NG+.
100 billion devices ready for AI by 2025, says Arm CEO
At COMPUTEX 2024, Arm CEO Rene Haas delivered a keynote speech that emphasised the company’s critical role in driving AI advancements across global computing programmes.
Cutting edge inductive position sensing
Melexis is a pioneer in programmable Hall sensors. Its devices offer improved manufacturability of sensor assemblies and modules.
AMD's AI and high-performance computing innovations unveiled at COMPUTEX 2024
AtCOMPUTEX 2024, Dr. Lisa Su, CEO of AMD, showcased the company's latest breakthroughs in AI and high-performance computing.
Harwin releases free whitepaper
Harwin has unveiled a new technical paper addressing the implementation of sturdy board-to-board interconnects for high-performance data and power connectivity, while tackling the challenges posed by high-speed automated manufacturing processes, which can sometimes affect quality and long-term reliability.