Search results for "dc-dc converters"
What is a half bridge?
A half bridge, also known as a half-bridge converter or half-bridge circuit, is a fundamental topology used in power electronics.
Vishay Intertechnology Gen 3 1200 V SiC Schottky diodes
Vishay Intertechnology has introduced 16 new Gen 3 1200 V silicon carbide (SiC) Schottky diodes.
600-V 30-mΩ GaN FET with integrated driver, protection and temperature reporting
The LMG342xR030 GaN FET with integrated driver and protection is targeted at switch-mode power converters and enables designers to achieve new levels of power density and efficiency.
TI, Delta Electronics to advance onboard EV charging
Texas Instruments (TI)and Delta Electronics will collaborate long term to create next-generation electric vehicle (EV) onboard charging and power solutions.
IDTechEx explores quantum dots
The use of quantum dots in displays has made it to high-quality prototypes amongst established tech companies like Samsung, Sharp, and TCL. These semiconductor nanocrystals, the size of just 2-10 nanometres, can enable realistic and high-definition displays for TVs, monitors, and smart tablets.
LMG3522R030-Q1 by Texas Instruments
The LMG3522R030-Q1 GaN FET with integrated driver and protections is targeting switch-mode power converters and enables designers to achieve new levels of power density and efficiency.
Microchip PCIM 2024: on-board charger design made easy
At PCIM 2024, Microchip announced its On-Board Charger (OBC) solution that uses a selection of its automotive-qualified digital, analog, connectivity and power devices, including the dsPIC33C Digital Signal Controller (DSC), the MCP14C1 isolated SiC gate driver and mSiC MOSFETs in an industry-standard D2PAK-7L XL package.
Award winners of the PCIM Europe Conference 2024 announced
As the PCIM Europe Conference commences, the winners have already been announced. A jury selected five exceptional submissions for their outstanding work.
Addressing SiC & GaN T&M concerns at PCIM 2024
As PCIM 2024 kicks off, addressing SiC & GaN test & measurement (T&M) concerns is one of the many topics taking centre stage, with companies like Rohde & Schwarz revealing new products that address these problems.
PCIM: Probing system targets SiC/GaN designs
Rohde & Schwarz is giving a sneak peek at its next generation R&S RT-ZISO isolated probing system at PCIM Europe in Nuremberg (June 11-13).