Yokogawa releases reflectometer

It provides a spatial resolution of 40µm and exceptional back reflection measurement sensitivity down to -100dB or lower, with no spurious noise.

Combined with the optional sensor head unit, users can measure insertion loss simultaneously alongside back reflection, making the AQ7420 an efficient and cost-effective reflectometer for optical market applications.

The solution came out of the company's awareness of emerging demands that could not be satisfied with existing market solutions; even more reduction of spurious noise; simultaneous measurement of back reflection and insertion loss; enhanced stability of measured waveforms; and faster measurement time.

As a result of this feedback, the objective was to develop a new solution that could meet these requirements - resuulting in the new AQ7420 high-resolution reflectometer. Two models are available: single-wavelength (1310nm) and two-wavelength (1310nm and 1550nm).

Also released is control software for Windows 11, an optional dedicated sensor head for loss measurement, various master codes (compatible with a variety of connector types) and a distance adjustment code to adjust the measurement starting position.

The main new features is the ability of the AQ7420 to reduce spurious noise. With conventional OLCR/OFDR technology-based devices, spurious (ghost) noise is often observable in areas where there is no actual reflection (depending on the characteristics of the equipment), which leads to misjudgments.

In these situations, correct waveform analysis relies heavily on users with specialist knowledge. In contrast, the new AQ7420 features technology that greatly reduces spurious noise, with ease-of-analysis.

Another feature of note is the potential to measure back reflection and insertion loss simultaneously. Conventional OLCR/OFDR instruments are often unable to inspect back reflection amount accurately due to the poor measurement accuracyof the vertical axis (amount of reflection level).

The AQ7420 high-resolution reflectometer counters this issue by enabling measurement with an uncertainty of ±3dB. Furthermore, by taking advantage of the optical sensor head, users can measure insertion loss simultaneously with an uncertainty of ±0.02dB.

Finally, another important feature is faster measurement time. Compared with the previous-generation product (AQ7410), the measurement time of the new AQ7420 high-resolution reflectometer is around 50% quicker, approximately 6 seconds compared with 12 seconds beforehand.

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