Yokogawa launches SMU to speed chip development
Yokogawa Test & Measurement’s AQ2300 series high-performance, high-speed SMU (Source Measure Unit) has hit the European marketplace.
Addressing various density needs for semiconductor/communication devices, the AQ2300 series modular SMU offers high-quality pulse generation alongside high-precision voltage/current generation and measurements.
Thanks to its inherent productivity and expandability characteristics, the 2-channel SMU module also saves time and space when performing the typically complex measurement functions essential for semiconductor devices.
The proliferation of smartphones and tablets, the rise of AI, and the expansion of autonomous vehicles is increasing the need for communication infrastructure to enhance speeds and address future power demands.
For laser devices in particular, engineers must undertake accurate sourcing of the mainly current signals that optimize laser control, adjusting the inputs accordingly to measure the precise output of laser light.
To aid engineers Yokogawa developed its new SMU with high levels of precision, functionality and modularity to keep pace with the miniaturization of next-generation devices and the increasing complexity of measurements required for R&D evaluation.
Highly modular, the SMU allows users to select the number of channels required (up to 18) to meet system needs within a limited space, supporting efficient facility operation.
High-quality pulse waveform generation (50 μs-width) is also an important feature. This function suppresses the heat generated by the device during testing, making more accurate measurements possible.
The rise and fall times may be disturbed due to the device or wiring, but by adjusting the parameter settings, a smooth output waveform can be achieved.
Interoperability is a further feature of note. AQ2300 series SMUs have trigger ports not only on the frame side, but also on each SMU channel. Moreover, in-frame synchronization functionality allows flexible selection of the connection method. In total, three trigger synchronization functions are available - synchronization of frames with external equipment; synchronization of SMU channel with external equipment; and synchronization between SMU channels.
The frame can also feature a digital I/O interface that enables co-operation with external devices. Frames are available in 3-slot or 9-slot types and suit flexible adaptation to small and medium-sized measurement systems. Importantly, the AQ2300 series SMU provides flexible measurement timing control in support of better overall system performance.
Regarding productivity, the AQ2300 series offers the ability to perform simultaneous measurements of voltage and current.
Furthermore, by accelerating communication within the frame and between a PC, the new SMU fosters elevated levels of work efficiency, where high-speed data transfer reduces the total measurement time and significantly enhances operational efficiency.
Target markets cover:
- R&D institutes developing new advances in optical communication devices
- Manufacturers of optical semiconductor components such as laser diodes, photo diodes, LEDs and modulators
- Manufacturers of electrical semiconductor components that include transistors and FETs (field-effect transistors)
Applications include static testing of laser diode modules. The AQ2300 series SMU can generate different voltages or currents from several channels and use the sweep synchronization function to measure the I/V or I/L characteristics of optical communication devices like laser diodes. It can also perform wavelength-I measurements on photo diodes in synchronization with a tunable light source.
The SMU can also be used for filter characteristic testing of WDM (wavelength division multiplexing) photo-diode modules. The instrument can generate different voltages or currents from several WDM channels and use the sweep synchronization function to measure the filter characteristics of each individual channel