JTAG Adds Boundary-Scan Capability to 6TL Functional Testers

5th February 2013

ES Admin

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JTAG Technologies announce a high-level JTAG support option for the YAVJTAG and YAVJTAH modules. The new solution allows 6TL users and systems builders to provide JTAG Test and in-systemprogramming capabilities using JTAG Technologies’ proven software platforms, such as ProVision and Production Integration Packages.

According to Peter van den Eijnden (MD JTAG Technologies) – “We are finding more and more opportunities where complementary test techniques, such as boundary-scan and functional test, provide the optimum solution for our customers – combining the strengths of JTAG Technologies and 6TL will provide another win-win combination.”

The YAV9JTAG and YAV9JTAH tester cards are part of 6TL’s ‘YAV’ series, developed to allow test engineers to build fully equipped functional test systems quickly and economically. Both units offer over 100 channel of digital I/O that can be controlled by a JTAG (IEEE std. 1149.1) interface and are connected to the target to extend the coverage of boundary-scan through to PCB connectors and/or test points.

The YAV9JTAG also includes an embedded boundary-scan controller that is compatible with JTAG Technologies’ developer and run-time systems making this a self-contained JTAG tester. The YAV9JTAH on the other hand features eight each of analogue measurement and stimulus channels in addition to the digital I/O plus two serial (RS232) ports. Control of and taking measurements from the YAV9JTAH is achieved via a boundary-scan controller, such as JTAG Technologies’ JT 37x7 JTAGPR116 – 6TL Page 2 of 3 DECA-414 ‘DataBlaster’ family, the more compact JT 3705/USB Explorer model or even the YAV9JTAG companion product.

David Batet, Sales Director from 6TL, says, “We developed the YAV JTAG hardware to satisfy customer demands for integrating boundary-scan scan and functional test techniques in our compact system platform. Now, we can also boast a world-class developer tool [JTAG ProVision] supporting the YAV’s embedded boundary-scan controller. This will inevitably be beneficial to JTAG and 6TL customers and prospects alike.”

Users of integrated JTAG Technologies’ products benefit from off-line, fixtureless test preparation and the re-use of stand-alone applications at other stages of the product lifecycle such as prototyping and field service.

Furthermore, the combination of functional test and boundary-scan draws on the strengths of both technologies and achieves excellent cost-effectiveness through reduced test fixture complexity.