Test & Measurement

Vi TECHNOLOGY to show its new 3D AOI System at APEX

18th February 2016
Peter Smith
0

Vi TECHNOLOGY will exhibit at the 2016 IPC APEX EXPO and will show its new 3D AOI, coupled with PI series (3D SPI) and SIGMA Link, resulting in a complete 3D inspection solution. K Series3D is the latest evolution of the successful K Series that has been delivering the most accurate component inspection to worldwide leaders in the electronics manufacturing industry for years.

By combining its extensive 2D AOI and 3D SPI experience with new proprietary technologies, the K Series3D delivers highly accurate all-around defect coverage including lifted components, lifted leads, tombstones, etc., for components up to 25 mm in height. Coupling high quality telecentric 2D images with dual camera blue-laser-based 3D profiles guarantees superior inspection quality for both pre-reflow and post-reflow.

K Series3D also is available as a cost-effective 3D AOI upgrade to existing 5K, 7K and 9K systems.

 

 

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