Advantest's T2000 8-Gbps Digital Module for High-Speed Testing of SoCs

The T2000 8GDM has the versatility to test a wide range of SoC interfaces while operating at data rates up to 8 Gbps. Key capabilities include clock and data recovery, jitter injection, I/O dead band cancellation and multi-strobe operation. The module is available in an Enhanced Performance Package capable of functional test abstraction, which can further shorten cycle times and streamline debugging.

“With its higher density and performance, our new T2000 8GDM positions us to capture even more market share in testing complex SoC devices with high-speed interfaces in multi-time domains,” said Dr. Toshiyuki Okayasu, executive officer and executive vice president of the SoC Test Business Group at Advantest Corporation.“ Both the FTA and EPP features enable system-level functional testing of these targeted semiconductors.”

Advantest’s module and tester designs are not only high performance, but also reduce test costs and time to market with high-throughput, multi-user environments and concurrent test capabilities – all key performance attributes for overseas production facilities.