Source measure unit addresses high-power device applications

Its dual 18-bit high speed digitisers facilitate measuring actual device operation that can be graphically displayed right on the front panel for immediate analysis. Researchers, scientists and design engineers developing next generation high-power materials and devices need the ability to make measurements at a variety of DC and pulse power levels for verifying device performance, while at the same time minimising the effects of device self-heating that often result in device or module failures.

This applies to such segments as materials research, semiconductor devices, circuit protection devices, advanced lighting technologies, energy storage and generation components, and power management electronics used in consumer electronics.

"Green initiatives and energy efficiency standards worldwide are driving the need for more efficient power semiconductor devices and systems," said Mike Flaherty, general manager, Keithley product line at Tektronix. "The latest high-power applications are very demanding, requiring test instrumentation capable of characterising significantly higher currents, higher power levels, higher peak currents, and lower leakage currents than ever before."

Like the other Keithley graphical SMUs from Tektronix, the 2461 incorporates a simple and intuitive Touch, Test, Invent process that minimises the learning curve and accelerates test setup for faster time to answer.

The graphical touchscreen interface allows users to interact with results right on the front panel using natural gestures similar to a smartphone or tablet and to quickly zoom in and out of data while conducting detailed analysis.

A built-in open source scripting language enables users to create libraries of reusable, customisable test software for specialised measurement applications.

The 2461's 10A/100V, 1000W pulse power enables engineers to apply more power to a device for a shorter period of time to minimise self-heating effects in a device under test compared to DC current testing that can mask its true operation.

DC testing can also damage devices if the current is applied for too long. With its 18-bit dual 1MS/s digitisers, the SMU can measure and visualise actual device operation, waveforms, and transient events of current and voltage simultaneously. The new fast "contact check" feature helps to minimise measurement errors and false product failures associated with contact fatigue, probe tip contamination, loose or broken connections and relay failures.

These capabilities give users more confidence in their test results so they can make faster design and engineering decisions.