Software Suite Speeds Wireless Test Times

Up to eight devices can be tested at the same time using a dual channel Multi-UE architecture that provides eight bi-directional RF ports in a single 19in. chassis.

The software's ability to test multiple devices in parallel is achieved using a multi-way active RF combiner module that supports connection of up to four devices to each channel. This approach achieves an almost four-fold throughput improvement per radio when compared with an equivalent serial test method, for virtually the same cost.

It is optimised for speed regardless of whether implemented to test a single device or multiple devices in parallel. The key to RF test system efficiency lies not just in raw test speed but also in optimising test equipment utilisation. Efficient test system development minimises equipment idle time both within and across measurement steps. PXI Maestro features a multi-threaded intelligent sequencer to exploit the benefits of modern multi-core PCs. This ensures that different tasks both within a measurement step and across a measurement sequence are overlapped or executed concurrently rather than sequentially as with conventional instrumentation. Multiple threads manage device control, test equipment setup and measurement processing in a tightly coupled manner. Where multiple different measurement are performed at the same test condition the software saves time and executes them in parallel on the same captured data.

PXI Maestro is an extension to the existing Aeroflex PXI 3000 Measurement Suites for GSM/EDGE, WCDMA, LTE FDD and WLAN, and is supplied with built-in support for the direct control of leading cellular chipsets