SoC test system offers high performance & scalability

“Our offering is unique in the world of test development service providers,” said Scott Bulbrook, Vice President of Engineering, DA-Integrated. “As we design and implement test access and custom BIST (Built-In Self-Test) circuits for our customers’ advanced node SoC devices, targeting the V93000 Smart Scale for production test is a great fit. Our seamless integration of verification environments into ATE test programmes is supported nicely by Advantest’s SmarTest Software.”

“We have been in partnership with DA-Integrated for several years now, successfully providing semiconductor manufacturers with a proven path from engineering development to high volume production,” said Hans-Juergen Wagner, Senior Vice President, SoC Product Group, Advantest Corporation. “This repeat order from DA-Integrated further validates the advanced performance capabilities of our V93000 platform, and when coupled with DA-Integrated’s comprehensive IC design and test development services, the solution offers customers accelerated time to market and high fault coverage at the lowest possible cost of test.”