Semiconductor test platform accommodates PXI/PXIe modules

The TS-960e builds on the integrated open-architecture of the TS-900 platform and accommodates PXIe and PXI modules - providing high-performance digital, mixed-signal, and RF test capabilities in a compact, single chassis footprint.

The TS-960e platform combines 256, 125 MHz digital I/O channels with per-pin-PMU with multiple RF and analog test instruments in a single, 21-slot PXIe chassis.

Available as a bench top or with an integrated manipulator, it takes full advantage of the PXIe architecture to achieve a full-featured test solution for digital, mixed–signal or RF test applications.

The GX5296 delivers high-performance digital test capabilities and is ideal for addressing verification, focused production, and failure analysis test needs - or for replacing legacy test systems. It builds on the GX5295 digital subsystem , offering timing, edge-placement, density, memory, and parametric measurement capabilities.

When combined with MTS’ advanced semiconductor software suite that includes program development and debug tools, comprehensive file conversion tools for WGL, VCD/eVCD, STIL , and ATP formats, and semiconductor-specific test modules including Shmoo plots and IV curve, the TS-960e provides  no-compromise digital / mixed-signal / RF test capabilities for component, SoC and SiP devices.

The TS-960e is available with Keysight Technologies’ portfolio of PXIe RF instrumentation which can address a wide range of RF applications including WLAN, Bluetooth, Cellular, EW, and RF transceivers.

Available instrumentation options include Keysight Technologies’ vector transceiver, vector signal analysers and generators, and vector network analyser PXIe modules; offering wafer and packaged RF test capabilities from 9KHz to 27GHz.

All of these modules as well Keysight’s VSA measurement application software are fully integrated with the TS-960e’s system software, ATEasy.