Power semiconductor test platform meets JEDEC standard

It performs a combination of thermal and electrical cycles to verify new products, processes and materials including (SiC) Silicon Carbide based semiconductors or devices designed to meet RoHS requirements. The system is designed to accelerate any failure mechanisms in the device in order to determine its life and functional operating limits.

Key features of the system includepower cycles to provide thermal and electrical stressing of device under test (DUT), highly accelerated life testing of DUTs, trend monitoring with user defined warning and control limits, junction temperature measurement, rapid DUT temperature cycling and ambient temperature profiling, detection of nascent failures with automated alert mechanism and DUT isolated control.

Typical applications for the Intepro SemTest include, design engineering verification, design characterisation and manufacturing validation and to simulate harsh electrical and environmental conditions demanded of the automotive, aerospace, defence industries and transportation.

Operational test modes include, linear, switched, saturated, voltage breakdown and avalanche. Typical DUT parameters measured include junction/DIE temperature, DUT terminal voltage, DUT current and power, ambient power and temperature and elapsed test times and test cycles.

The SemTest HT80 consists of a temperature chamber rated at 60 to 225°C, +/-2°C and associated hardware rack that provides the test hardware. Internal racks are included to mount the DUT carrier cards and internal temperature is maintained with LN2 cooling.

The equipment rack consists of a Card Cage Assembly installed in the rear wall of the Temperature Chamber. The rear wall contains 10 slots that align with the FSD Module connectors. The combination of the Card Cage Assembly and Temperature Chamber will make up a Chamber Assembly.

The Chamber Assembly requires support from aSystem Cabinetthat houses the system power supplies, measurement electronics, PC Controller, and the PowerStar control and operational software.

The heart of the system is the Force/Sense DUT (FSD) Module. This module is a 6U euro-card format that has a front panel control/monitor interface and a rear connector where the DUT Carrier Card will mount. Each FSD module controls up to 8 DUT Test Cells and it provides local force, sense and control signals for HTRB and HTGB testing. Each DUT can be individually controlled by the FSD Module. As each FSD Module houses 8 DUTs, a total of 10 FSD Modules will be required for a single SemTest HT80 system. The system may be expanded in blocks of 80 DUT to 160, 240, 320 etc.

The system continuously monitors the current flow in each DUT. If at any time the current exceeds the set limit, the supply voltage to this the device is turned off to prevent damage. All other DUTs continue to be tested.