Parameter analyser reduces characterisation complexity

This new instrument features a modern industrial design, a new graphical user interface and a range of helpful self-learning tools such as expert instructional videos embedded into the instrument.

The result is up to 50 percent reduction in test setup times and significantly easier and more intuitive operation. Usability is particularly important for applications such as semiconductor device research, device failure analysis or reliability testing where instruments are a shared resource among multiple users.

Knowing that various measurements add additional complexity to semiconductor research, Tektronix is also introducing the Keithley 4200A-CVIV four channel IV/CV switch module.

This module for use with the 4200A-SCS mainframe provides on-the-fly switching between SMU (I-V) and capacitance-voltage (C-V) measurements, allowing users to move C-V measurements to any device terminal without lifting prober needles or moving cables.

With a new widescreen high-definition display, the 4200A-SCS offers more screen real-estate for interactive testing and experimentation.

This display is coupled with a completely new graphical user interface that delivers the intuitive operation sporadic users need while still offering the advanced features required by expert users. The new user interface includes expert videos delivered by Keithley application engineers from around the world.

These videos reduce the user’s learning curve and help them troubleshoot when unexpected results occur while building confidence in the results they are seeing.

The instruent is a modular, fully integrated parameter analyser that performs electrical characterisation of materials, semiconductor devices and processes.

Consisting of Source Measure Units for I-V characterisation, Capacitance-Voltage module for AC impedance measurements, and Ultra-fast Pulse Measure Unit that performs pulsed I-V, waveform capture, and transient I-V measurements, the 4200A-SCS provides the researcher or engineer with critical parameters needed for materials research, semiconductor device design, development or production.