New PXI Module enables Combination JTAG/Boundary Scan and dynamic Functional Test

The PXI 5396-x modules offer 96 individually configurable single ended channels and support the structural JTAG/Boundary Scan test as well as dynamic I/O operation up to 100MHz to execute functional tests.

“For users with mission critical applications, Boundary Scan and real-time testing are substantial parts of the entire test strategy, hitherto executed with different equipment”, Karl Miles, Manager (UK operations) for GOEPEL electronics Ltd., explains. “The new PXI modules overcome this separation based on a high-performance, standardized platform, which enables our customers to test effectively and save costs at the same time.”

PXI 5396-x are 1 Slot 3U modules, which differ in on-board memory depth of 72MB (PXI 5396-X) and 144MB (PXI 5396-XM). All modules offer 96 channels single ended channels configurable as input, output and tri-state, which allow simultaneous driving, measuring and real-time comparison.

While the signals are processed to test bus operations completely synchronous in the JTAG mode, the dynamic I/O mode enables functional testing with freely programmable clock frequencies from 500Hz to maximum 100MHz. That’s why, first structural Boundary Scan tests and afterwards functional tests can be executed with the same instrument.

Groups of 32 channels between 1.8V and 5V can be voltage programmed for the flexible adaptation of the instrument to the unit under test (UUT). Additionally, Pull/Up and Pull/Down can be set for each channel. All channels have additional safety measures such as “unstress” and increased current spreading rate based on the well-proven CION interface-ASIC. Up to five PXI 5396-x modules can be cascaded to an I/O brick, whereby all PXI trigger signals are supported for synchronisations. The module’s flexibility is determined by the implemented VarioCore® technology, which enables the application of customized IP embedded in the instrument’s hardware.

Standard kits, e.g. Virginia Panel Corporation, are optionally available for modules’ coupling with commercial interface test adapters (ITA).

In terms of software, the PXI 5396-x modules are fully supported in the Integrated JTAG/Boundary Scan Development Environment SYSTEM CASCON™ from version 4.4.1 onwards which frees users from time consuming manual project data processing. This includes the automated generation of wiring lists, automatic test program generation (ATPG) as well the utilisation of the graphical multi-mode debugger. SYSTEM CASCON controls the PXI 5396-x modules’ I/O channels via HYSCAN™, an interface that enables the simultaneous handling of serial and parallel vectors. In the case of detected connectivity defects, a respective fault diagnostics processor is executed after test execution to obtain pin level and net level diagnostics. The fault location can optionally be visualized in layout and schematic representations of the UUT.

The execution of functional dynamic tests and the following fault diagnostic are based on recently into SYSTEM CASCON™ integrated IEE Std. 1445 Digital Test Interchange Format (DTIF).