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Keithley Microsite Offers Access to Informative Photovoltaic Measurements Seminar, Online Solar Cell Demo

20th July 2009

Keithley Instruments GmbH

ES Admin

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Keithley Instruments has created an application-specific microsite for those responsible for characterizing solar/photovoltaic devices. “Simplify Your Solar Cell Testing with Keithley’s Precision Measurement Solutions” describes Keithley’s high accuracy solutions for solar cell I-V and C-V characterization, which allow high speed testing without the hassles of integrating separate instruments or writing complicated programs. It also describes key solar cell parameters and measurement techniques. To visit this microsite, go to www.keithley.com/solar_cell.

The microsite offers access to a pre-recorded seminar titled “Photovoltaic Measurements: Testing the Electrical Properties of Today’s Solar Cells.” An online demonstration provides a high-level overview of how Keithley’s ACS Basic Edition systems can be applied to solar cell characterization. Other Keithley solutions profiled include the Model 4200-SCS Semiconductor Characterization System, Model 2602A System SourceMeter® Instrument, and Model 2440 or Model 2425 SourceMeter Instruments. Microsite visitors can also request Keithley’s solar cell test information kit.

Keithley Instruments, Inc., a leader in semiconductor device characterization and parametric test, offers customers around the world a variety of flexible solutions for current-voltage (I‑V), capacitance-voltage (C-V), and pulsed I-V measurements and analysis. Products range from benchtop instruments to turn-key systems and are used in applications as diverse as materials analysis, device characterization, wafer level reliability, and process control monitoring. Keithley works closely with semiconductor customers worldwide through its network of field service centers and application engineers with specific expertise in the area of semiconductor technology.