Test & Measurement

Navigating test & measurement in Rohde & Schwarz seminars

15th October 2024
Caitlin Gittins
0

The 'Navigating T&M Instruments' seminar, designed to cater for all levels of experience, will feature a series of presentations led by test and measurement experts from Rohde & Schwarz

The seminar will cover various application areas such as digital communications and power electronics, with speakers showcasing the flexibility of the latest instruments. Attendees will also be guided on how to maximise the capabilities of their current instruments, ensuring accurate and repeatable measurements consistently.

Each session will focus on a distinct topic, beginning with a presentation titled ‘Looking after RF connectors’ by Product Manager and Application Engineer, Abbey Berry. This session will examine RF coaxial connectors, highlighting key electrical and mechanical considerations, particularly for precision connectors, and will offer practical advice on handling and maintenance.

Following this, Nick Le Bas, Product Manager and Application Engineer, will present ‘Oscilloscope Fundamentals’, offering an introduction to time domain measurements, discussing typical applications, and exploring key factors to consider when using oscilloscopes.

Engin Kodal, Product Manager and Application Engineer, will present on ‘Analogue and Vector Signal Generation’. This session will delve into signal generator architectures, outlining the differences between analogue and vector sources, and identifying typical application areas.

In the afternoon, Mark Bailey, Product Management Lead in the UK, and Engin Kodal from Ireland, will jointly deliver a presentation on ‘Spectrum & Signal Analysis’. This session will explain the architecture of spectrum analysers, considerations when conducting measurements, how these differ from signal analysers, and which applications require each type of instrument.

Rounding off the seminar will be an in-depth, two-hour session on ‘Vector Network Analysis’, where Jamie Lunn, Vector Network Analyser Product Manager, will cover the fundamentals of S-Parameters, formatting complex data, common sources of measurement errors, and best practices for calibration. Jamie will also provide insights into the hardware architecture of a Vector Network Analyser (VNA), techniques to reduce errors through calibration, and methods to achieve precise, repeatable measurements.

The 'Navigating T&M Instruments' seminar, hosted by Rohde & Schwarz, will take place at two key locations, aiming to meet the needs of engineers throughout the UK and Ireland.

 

 

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