NIWeek: Wireless test system cuts manufacturing costs
The Wireless Test System (WTS) from NI is claimed to be a solution that dramatically lowers the cost of high-volume wireless manufacturing test. It says that the system is optimised for measurement speed and parallel test. The WTS combines multi-standard, multi- DUT and multi-port testing non the PXI platform.
When used with flexible test sequencing software, such as the TestStand Wireless Test Module, manufacturers can significantly improve instrument utilisation when testing multiple devices in parallel. The test system integrates into a manufacturing line with ready-to-run test sequences for devices that use chipsets from suppliers like Qualcomm and Broadcom as well as integrated DUT and remote automation control.
The WTS is the latest system from NI built on PXI hardware and LabVIEW and TestStand software. It launched a semiconductor test system last year.
With support for wireless standards from LTE Advanced to 802.11ac to Bluetooth Low Energy, the WTS is designed for manufacturing test of WLAN access points, cellular handsets, infotainment systems and other multi-standard devices that include cellular, wireless connectivity and navigation standards.
Software-designed PXI vector signal transceiver technology inside the WTS delivers superior RF performance in the manufacturing test environment and a platform that can scale with the evolving requirements of RF test.
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